ISSN:
1432-0630
Keywords:
PACS: 06.90; 07.20; 44.90
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract. We report thermal diffusivity measurements of thin Niobium films on glass substrates, using OptoThermal Transient Emission Radiometry (OTTER). The result is a thermal diffusivity value of D=(2.79±0.36)× 10-5 m2/s, which is within 17% of the accepted value for multicrystaline bulk niobium. The technique is remote sensing, non-destructive, and the measurements depend only on the thickness of the film and the thermal properties of the substrate.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01538537
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