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  • 1
    Electronic Resource
    Electronic Resource
    Magnetic and physical microstructure of Fe16N2 films grown epitaxially on Si(001) : The 41st annual conference on magnetism and magnetic materials (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 4128-4130 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial Fe16N2 films were grown on Si(001) substrates with an Ag underlayer by reactive sputtering in nitrogen. Pure α′-Fe8N films were obtained which on subsequent annealing resulted in mixtures of α′-Fe8N (54%) and α′′-Fe16N2 (46%). An average moment of 1780 emu/cc, considerably larger than that of pure α-Fe (1714 emu/cc), was measured for both samples. Plan-view transmission electron microscopy of the films confirms the orientation relationship Fe16N2(001)||Ag(001)||Si(001) and Fe16N2[100]||Ag[110]||Si[100], and a small grain size (∼100 Å), while electron energy-loss spectroscopy confirms an average composition of Fe8N for both samples. Electron diffraction patterns indicate that the as-deposited α′ films already contain very small regions of ordered α′′ which were not previously detected by x-ray diffraction measurements. Mössbauer spectroscopy performed at both 300 and 16 K gave three hyperfine fields corresponding to three different iron sites for both the unannealed α′ and the annealed α′/α′′ mixtures. Lorentzian fitting of the three iron components for the α′/α′′ spectrum obtained at room temperature gave an intensity ratio of 1:2:1 (FeI:FeII:FeIII) corresponding to the expected occupancy for the three Fe sites in the Fe16N2 structure. Moreover, the pure α′ film at 300 K and both samples at 16 K showed deviation from this distribution. The three components show notable differences in the temperature dependence of their occupancies; however, all three magnetic components deviate similarly from the surface normal. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365102
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  • 2
    Electronic Resource
    Electronic Resource
    Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure : The 7th joint MMM-intermag conference on magnetism and magnetic materials (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 6810-6812 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interfacial coupling energy, Δσ for polycrystalline Ni0.8Fe0.2 (100 Å)/MnxPt1−x (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1−x composition range 0.42〈x〈0.76 and t∼350 Å. Δσ exhibits a sharp peak of 0.1 erg/cm2 at 51% Mn. We compare the magnetic and microstructural properties of two bilayer films, which have the same compositions of permalloy and MnxPt1−x: [Ni0.85Fe0.15(100 Å)/Mn0.49Pt0.51(t Å)]. In one case (normal structure), the epitaxial permalloy was grown first onto Pt/MgO(001), followed by 170 Å of Mn0.49Pt0.51. In the other structure (inverted), a 350 Å thick polycrystalline film of Mn0.49Pt0.51 was grown onto a SiO2 substrate, followed by permalloy. The structures exhibited very different exchange bias fields (32 versus 86 Oe) and Δσ values (0.021 versus 0.060 erg/cm2), respectively. Significant differences in texture, grain size, and Mn0.49Pt0.51 layer thickness for the two samples are reported. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.367815
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    Paper (German National Licenses)
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