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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 2023-2026 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A novel electrostatic analyzer for energetic charged particles has been developed that has a simple geometry and has demonstrated a wide field of view (90°×4° in the prototype device). The bandpass of the device can be adjusted by changing the size of the entrance and exit apertures, and the design intrinsically retains information about the spatial distribution of the incoming particles. Comparisons between numerical simulations of the device and laboratory tests are presented.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4174-4179 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a new compact thermal ion sensor suitable for spaceflight or laboratory applications. The device is highly sensitive and has a wide dynamic range due to its use of a microchannel plate charge multiplier. It allows spatial variations in velocity and anisotropic temperatures to be measured in a flowing plasma stream using a segmented anode. It has a high rejection to solar UV due to the trajectories of the particles within the device. The device has been flight tested as part of the Charging Hazards and Wake Studies flight experiment and sample data from the flight are presented. We discuss interpretation of the output of the device including extracting the parallel and perpendicular temperatures and the flow energy of a plasma stream. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 507-508 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple electrostatic retarding potential analyzer (RPA) configuration is described that gives a true measure of charged particle energy irrespective of the angle of incidence of the particles. The device has an inherently high energy resolution (ΔE/E〈0.01). The device eliminates errors in particle energy measurement usually associated with planar gridded RPAs. Electrostatic models and results from an experimental prototype are presented.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 1597-1600 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A laser deflection measurement system has been developed which is both fast (τ≈20 ns) and sensitive (δφ≈0.5 μrad). This diagnostic is capable of sensing and discriminating between electrons and neutral particles in a multicomponent plasma, and yields quantitative results. The technique allows continuous measurements in time. Construction is inexpensive and simple to field. This system is, therefore, highly competitive with traditional techniques in diagnosing the development of transient plasmas.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1788-1791 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The energy resolution of a planar retarding potential analyzer can be optimized by using multiple retarding grids and varying the potential applied to the outermost grids. When properly biased, such an analyzer configuration can closely approach the energy resolution of an ideal device. As an added benefit, such an analyzer can be made highly transparent without sacrificing energy resolution. Experimental results verify the solutions of particle-tracking codes for multiple-grid configurations.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 3329-3334 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The unique equilibrium electric field configuration for a planar dielectric/vacuum interface subjected to electric stress is found, based on the requirement that the local electric field be inclined to the dielectric surface at the critical angle at which the secondary electron yield of electrons impacting the dielectric surface is unity. The critical angle is independent of the magnitude of the applied field and is a function of material properties. The electric field, potential, and charge distributions are calculated for several orientations of the interface versus the applied stress field. The results show that when the surface is charged, the electric field may be enhanced near either the cathode or the anode depending on whether the angle of the interface is greater or less than the critical angle. This is in contrast to the uncharged case, for which the field is always enhanced near the narrow end of the dielectric independent of the polarity of the applied field. The equilibrium surface charge distribution is not constant over the surface and varies in sign with the orientation of the interface. The magnitude depends on both the critical angle and the relative permittivity of the dielectric. The implications of these results for researchers and designers who are investigating or using high voltage is discussed.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Plasma chemistry and plasma processing 7 (1987), S. 89-99 
    ISSN: 1572-8986
    Keywords: Insulator flashover ; ultraviolet ; surface plasma
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Technology
    Notes: Abstract Ultraviolet-induced flashover has been observed over stressed, angled, acrylic insulators illuminated by a short (60 ns) pulse of excimer laser light at 249 nm. Flashover has been observed at ultraviolet fluences of 5–65 mJ/cm2 for electric field stresses approximately 10–30% of static breakdown stress. Insulators at positive angle (conventional configuration) exhibit a reduced tolerance to ultraviolet light versus insulators at negative angle (unconventional configuration) by approximately a factor of 2, while the presence of impurities at the triple point reduces the tolerance to ultraviolet even further. Flashover is related to the fluence, rather than the power density, for short pulses, and the production of photoelectrons is a likely mechanism for the initiation of flashover.
    Type of Medium: Electronic Resource
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