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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2860-2863 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An analysis of two-dimensional fast Fourier transform from images of periodical lattices (like highly oriented pyrolytic graphite) has been performed to understand and decouple the various parameters which account for distorted images in stylus microscopy. The effects of the various sources of image distortion have been described by means of linear maps and a mathematical approach has been developed to find the various correction coefficients resulting from the Fourier space analysis which restore the correct geometry of the images. Furthermore, the trend analysis of the distortion angle upon the scanning frequency shows the possibility of decoupling the role of "static'' and "time dependent'' distortion parameters. This possibility may be used for an a priori prediction of possible distortions in stylus microscopy and thus for a real-time correction of the images during scanning.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 98 (1994), S. 13323-13327 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 111 (1999), S. 5562-5567 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Fatty acid Langmuir–Blodgett films, a quartz crystal microbalance, and Fourier-transform infrared dichroism have been used to study the evolution of the melting transition upon the variation of the sample thickness, from bulk to a few monolayers. Whereas ordinary bulk behavior was observed for samples all the way down to n=12 layers, a crossover range of 12≤n≤8 was identified to a continuous transition, characterized also by the existence of an intermediate orientationally ordered phase. Measurements on annealed samples indicated the strong sensitivity of such a phase and the order of the transition to defects and sample metastability. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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