Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
66 (1995), S. 271-272
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A simple transmission mode near-field optical microscope is demonstrated. A low noise, large area Si photodetector is mounted directly between the piezoelectric transducer scanning stage and the sample. This method provides a simple way to convert the commercial atomic force microscope/scanning tunneling microscope scanning stage to a near-field optical microscope. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145273
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