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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 2847-2851 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure of oxidized amorphous Tb-Fe alloy thin films prepared by magnetron cosputtering has been studied as a function of alloy composition and the substrate temperature at which the films were grown. Transmission electron microscopy and Auger electron spectroscopy with ion-sputter depth profiling were used to characterize the films. The composition of the alloy has no dramatic effect on the oxidation rate; it does, however, effect the microstructure of the α-Fe2O3 layer that forms on the alloy. Oxidized alloys originally containing more than 27 at. % Tb show an extremely fine-grained structure, with grain sizes on the order of 30 A(ring). Alloys containing less Tb developed large (1–2 μm) [001]-oriented single-crystal α-Fe2O3 grains amongst the fine-grained α-Fe2O3. For alloys with less then 18 at. % Tb, only the large grains remain. Samples grown at deposition temperatures ranging from 85 K to 400 °C show a similar structure after oxidation.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 1291-1296 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Amorphous Tb-Fe thin films prepared by dual magnetron cosputtering were exposed to air at 200 °C in order to investigate the evolution of the films as they oxidize. Magnetic properties of the films were measured using a vibrating-sample magnetometer and torque magnetometer and are interpreted in light of the structure of the films as revealed by Auger electron spectroscopy and composition-depth profiling. This leads to a detailed and self-consistent description of the oxidation process. At first a uniform and homogeneous oxidation layer grows from the surface toward the substrate. This layer has a high magnetization and low intrinsic anisotropy and consists of an intimate mixture of oxidized Tb and metallic TbxFe(1−x). The initially high intrinsic anisotropy of the unoxidized region decreases relatively quickly, while the composition changes only slowly as this region shrinks. When the oxidation layer reaches the substrate, two oxide phases (Fe2O3 and Tb2O3) begin to grow at the surface exposed to air.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 542-544 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of Fe or Co and rare-earth metals, such as Tb and Gd, are being developed as high density, mass memory storage media in magneto-optic devices. It is shown that a 10-nm duplex film consisting of a metal that is passivated in air, such as Cr or Al, and a diffusion barrier, such as Nb, will protect these alloys against oxidation and corrosion at temperatures up to at least 200 °C. The duplex film is better than a single passivated metal layer, which may interdiffuse with the alloy, or than a dielectric, which may be reduced by the reactive rare-earth element.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 30 (1958), S. 441-443 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of agricultural and food chemistry 7 (1959), S. 441-442 
    ISSN: 1520-5118
    Source: ACS Legacy Archives
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 7 (1985), S. 223-227 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A technique utilizing a layer by layer analysis has been developed for obtaining the composition-depth profiles of thin films from Auger electron spectroscopy (AES) combined with ion sputtering. The technique, which has monolayer resolution and gives significantly more accurate results than prior methods, has been used for analyzing the composition of the native oxide on a series of iron-chromium alloys. The new results differ significantly from those that do not consider layer by layer variations in composition, and they are in good agreement with those obtained some years ago by ion-scattering spectrometry (ISS). In addition, it was confirmed that no preferential sputtering of Fe or Cr occurs during argon ion sputtering of the alloys.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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