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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 53 (1981), S. 722-723 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 93 (1989), S. 392-397 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 3297-3305 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Amorphous organic thin films of N,N′-diphenyl-N,N′-bis(3-methylphenyl)-(1,1′-biphenyl)- 4,4′-diamine (TPD) and 4,4′,4″-tris(3-methylphenylphenylamino)triphenylamine (m-MTDATA) which function as hole transport materials were fabricated on slide glass plates by vapor deposition. By heating the films in air, the change in photoluminescence (PL) spectra for TPD was little, while that for m-MTDATA was significant and a new broad peak appeared in the longer-wavelength range. The latter change was pronounced in an oxygen atmosphere, but was suppressed in a nitrogen atmosphere. To clarify the difference in the effect of the storage conditions on the PL characteristics between TPD and m-MTDATA, these two films were also studied by the scanning force microscopy techniques of atomic force microscopy (AFM) and friction force microscopy (FFM). It was found from the observation by AFM that the m-MTDATA films showed no change in topography, while the TPD films were crystallized easily at room temperature in the air. However, it was found by FFM that the m-MTDATA film stored at 80 °C above Tg showed crystal-like structure, which was difficult to detect by topographic AFM imaging due to little morphological change. It was finally concluded from the above results together with FFM after scratching the film surface with the AFM tip(i) that the crystal-like structure was not due to crystallization of m-MTDATA itself, but due to the oxidation product of m-MTDATA, because the crystal-like structure was observed only near the surface; (ii) that m-MTDATA is better than TPD in terms of difficulty in crystallization of their amorphous films by heating, but is inferior to TPD in terms of oxidation and the film requires protection from atmospheric oxygen; and (iii) that FFM can be used to observe the reaction products over the film surface on the nano scale. Interdiffusion for m-MTDATA by heating in two layered films with tris(8-hydroxyquinoline) aluminum was more suppressed than that for TPD due to higher Tg and lower thermal structural change of the m-MTDATA film. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 7099-7115 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An accurate method to calibrate a commercial atomic force microscope (AFM) with commercial cantilevers for surface stress measurements was investigated. The bending of commercial rectangular cantilevers of the AFM was measured by laser beam deflection under a concentrated load mode and a bending moment mode. Good agreement between the experimental results and the theoretical predictions was obtained. The accurate calibration of the deflection angle for Δσ was possible with the rectangular cantilever by taking into account the dependence of the deflection angle on the laser spot position, a, on the cantilever. The cyclic voltammogram and the electrocapillary curve were measured in the double layer region of a gold thin film on the rectangular cantilever. In addition, it was concluded that a fairly good measurement of Δσ by triangular cantilevers was also possible as long as the deflection angle measurement was carried out with the same triangular cantilever at the same laser spot position a. The change in surface stress due to electrochemical oxygen and hydrogen adsorption was also studied on gold and platinum deposited on rectangular cantilevers. In these cases, the change in reflectance of the cantilevers by electrochemical reactions had to be taken into account for accurate calibration. The discussion described here will be also useful for other stimuli, such as pH, that cause the cantilever bending. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 2632-2634 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pulsed-force-mode atomic force microscopy (PFM-AFM) using a cantilever with a Si3N4 tip was applied to map charge distribution on a sample surface in water. In order to confirm the applicability of the present PFM, we prepared a patterned sample by vapor deposition of Al on a quartz plate covered with silica beads, followed by oxidation of Al with O2 and removal of the beads with ultrasonication. The two different areas of Al2O3 and SiO2 had different isoelectric points and bore positive and negative charge, respectively, at pH 8.6. The lateral resolution of the present method was found to be ca. 30 nm. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 3245-3247 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The scanning near-field optical microscopy imaging of specimens in liquid and of cultured cells in aqueous solutions is reported. A scanning near-field optical/atomic-force microscope (SNOM-AFM) was developed, in which the scanning of an optical-fiber probe cantilever over the specimen was controlled by noncontact mode AFM (dynamic mode AFM). This imaging mode reduces damage to the probe and soft specimens. The resonant frequency of the probe cantilever decreased 20% to ≈14 kHz and the Q factor decreased by a factor of 8 to ≈30 in water, compared with these values in air, which was sufficient to perform SNOM-AFM imaging in liquid. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1787-1789 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In order to clarify the propagation mechanism of dark spots in an organic multilayered electroluminescent device, in situ electroluminescence microscopy as well as photoluminescence (PL) microscopy and Auger electron spectroscopy of the degraded device was carried out. The difference in local PL spectra between the dark spots and the normal surface area was also observed by using scanning near-field optical/atomic force microscopy. The growing mechanism of the dark spots was proposed from these observations. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 272-274 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Characteristics of electroluminescent (EL) devices were improved dramatically using indium tin oxide (ITO) chemically modified with H-, Cl-, and CF3-terminated benzoyl chlorides. By the use of reactive –COCl groups, ITO surfaces were modified quickly and the work function of the modified ITO was changed widely depending upon the permanent dipole moments introduced in the para- position of benzoyl chloride. We also compared the performance of the EL devices with ITO modified with different binding groups (–SO2Cl, –COCl, and –PO2Cl2) of p-chlorobenzene derivatives. Finally, we examined the correlation between the change in the work function and the performance of the EL devices by the chemical modification and found that the enormous increase in ITO work function up to 0.9 eV is possible using phenylphosphoryl dichloride with a CF3-terminal group in the para-position. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 4211-4213 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An SbCl5-doped N,N′-diphenyl-N,N′-bis(3-methylphenyl)-1,1′-biphenyl-4,4′-diamine (TPD) thin film was studied as a hole-injection layer in low-molecular-weight organic electroluminescent (EL) devices. EL characteristics of devices with a TPD hole-injection layer doped with other oxidizing reagents, such as iodine, FeCl3, and tris(4-bromophenyl)aminium hexachloroantimonate were compared with that of SbCl5-doped TPD. The device with SbCl5-doped TPD on a cleaned indium–tin–oxide (ITO) substrate exhibited the best performance of all the devices studied. The improvement in device performance was attributed to an increase in work function of ITO due to acid formation as a result of hydrolysis of SbCl5 and by thinning the tunneling barrier for hole injection due to formation of the space charge region in highly doped TPD with SbCl5. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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