Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a fast measuring system of energy dispersive x-ray diffraction intensity. A solid state detector (SSD) has been used to measure the energy dispersive x-ray diffraction intensities. The energy resolution of SSD is almost ten times higher than that of a scintillation counter or proportional counter. For full use of SSD, a fast processing system of the signal is needed, especially when x rays from synchrotron radiation (SR) are used. When SSD is used for x rays from SR, however, we have two problems. One is that the dead time of conventional signal processing system is long, which prevents the efficient use of synchrotron radiation source. The other is that a fast data recording system is needed, because the number of data of a single diffraction spectrum is large. To solve these two problems, we have designed a new measuring system. The system consists of a personal computer and an interface board of multichannel analyzer function. The interface consists of peak hold, fast ADC, memory, add one, and DMA. (1) Improvement of the dead time. We adopted a successive approximation ADC to shorten the conversion time. The dead time is then 2 μs in the present system, which is much shorter than that of the Wilkinson ADC (about 40 μs). (2) Fast data recording. In most conventional MCA, the memory of MCA is separated from that of computer and the data are transferred between MCA and computer. In this case, the data are transferred by GP-IB or RS232C, and the data transfer time is several ten seconds. In the present system, the same memory is accessed by MCA and computer and the data transfer time is zero. This fast measuring system has already been installed at Photon Factory, KEK and utilized to measure the energy dispersive diffraction intensities. We have observed Pendellösung fringe induced by x-ray resonant scattering to make use of this system.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 117-122 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: According to the papers so far published about diffractometers with energy-dispersive detectors, the precision of a measured lattice spacing has been estimated to be about 0.05% at best. In the present paper, it is shown that a precision of about 0.01% is attainable without much difficulty by the use of a suitable Soller-slit system and a suitable scattering angle. This was demonstrated on an Al powder sample. It has been concluded that the limitation of precision is in the electronics rather than in the detector, when the necessary conditions are realised in the present improved system.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 9 (1976), S. 286-290 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A cryostat has been designed for an energy-dispersive X-ray diffractometer so that the specimen can be measured between 1.48 K and room temperature. Three powder samples can successively be measured at a fixed temperature by rotating the cryostat in steps of 120°. This design is very suitable particularly for detecting a slight change or difference, if any, in lattice constant among samples. A typical example is described of detecting the difference in lattice constant between 92Mo and 100Mo.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 13 (1980), S. 433-437 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A white-X-ray (Bremsstrahlung) four-circle diffractometer with a solid-state detector [Si(Li)] has been constructed. The system is operated by a small computer with magnetic disk memories, and enables energy-dispersive intensity measurements to be carried out with the X-rays selected from white X-rays. The present paper describes (1) how the present system can be used for energy-dispersive diffractometry even with the white radiation from a standard X-ray tube, and (2) how this system allows the measurement of the integrated intensities with almost the same accuracy as in angle-dispersive diffractometry with characteristic X-rays.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 5
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 15 (1982), S. 89-93 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A five-channel solid-state detector of Si(Li) type has been made together with the necessary data-collecting system. Its characteristics and a preliminary application on the intensity measurements and on the anomalous scattering near the Ga K edge of GaP as a function of X-ray energy are described.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 32 (1976), S. 245-249 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: It has experimentally and theoretically been confirmed that the intensity ratio rh of Friedel pair reflexions h and {\bar {\bf h}} is given by |Fh|2/|F_{{\bar {\bf h}}}2 in a perfect crystal as well as in a mosaic crystal both in the symmetrical Bragg case and in the symmetrical Laue case. The measurements have been carried out on a nearly perfect GaAs crystal plate in the energy range near the As K absorption edge by the use of the energy-dispersive diffractometer and continuous radiation. These results have shown, a reasonable agreement with the relevant theoretical curves. The limitation of the above relation in tile presence of extinction effects has been considered.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 7
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The anomalous scattering factor f' + if” of GaAs very near the K absorption edges has been investigated with the stress on the following two points. One is the determination of f' from the measured f” values through the linear absorption coefficient by calculation with the dispersion relation. The other concerns the effect of fine structures in the anomalous scattering factor on the integrated reflexion powers R555 and R{\bar 555} in the two ranges of ± 20 eV near the Ga K and As K absorption edges. The agreement between these calculations and measurements of R values is fairly good; this fact justifies the application of the dispersion relation to the determination of the f' values near the edge. Some advantages of this application are pointed out in terms of, particularly, the phase determination of reflexions from crystals with unknown structures.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 297-298 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The appearance and identification of escape peaks in an energy-dispersive X-ray diffraction spectrum are reported.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 396-399 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The polarity sense of the non-centrosymmetric GaP crystal has rapidly been determined by use of an energy-dispersive diffractometer by choosing a suitable scattering angle, where the anomalous scattering is heavy, for example for the 333 and \bar 3\bar 3\bar 3 reflections in a pair of measurements. The main merits of this method are: (1) The necessary scaling is easily carried out by use of the intensity of even reflections observed simultaneously; (2) Unwanted fluorescence contributions can generally be separated. These make the conclusion more reliable. It was thus established that the less shiny surface is the Ga side when a 111 plate of GaP is treated by an etchant (HF:HNO3 = 5:1).
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 8 (1975), S. 683-683 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A correction is given to Hosoya & Fukamachi [J. Appl. Cryst. (1973). 6, 396–399].
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...