ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
X-ray diffraction is used in combination with tensile testing for measuring elasticproperties of metallic thin films. Size effect, elastic anisotropy and grain morphologies areconsidered in all these experiments and supported by different kind of numerical simulationsoperating at different length scales. Such instrumental studies are time consuming even ifsynchrotron sources are used. New experiments are under progress for reducing acquisition data andimproving precision on strain measurements. After introducing briefly the main principles andresults of our techniques, first promising measurements on nanometric W/Cu multilayers using 2DCCD detectors and high monochromatic flux at the Advanced Light Source Berkeley (USA) onbeam line 11.3.1 are presented. In addition, simulation experiments for analyzing elasticity intextured gold film are discussed
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/13/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.524-525.735.pdf
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