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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5795-5795 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Co/Pt multilayers with large Kerr rotations at short wavelengths and the magnetic and material properties desired for magneto-optical (MO) recording have been studied extensively as potential future MO materials. Very good recording performance has been demonstrated.1 However, the typical constituent layers in Co/Pt multilayers are very thin, 0.2–0.4 nm Co layers and about 1 nm/Pt layers. To manufacture Co/Pt multilayers consisting of 10–30 periods of such thin Co and Pt layers is certainly quite a challenge. One would prefer to deal with CoPt alloys if the alloys can be made to have large perpendicular magnetic anisotropy and coercivity. Previously no one was able to directly deposit CoPt alloy films with large perpendicular magnetic anisotropy and saturated remanence. Here we will demonstrate for the first time that CoPt alloy films with large perpendicular magnetic anisotropy and coercivity, and saturated remanence can be directly deposited by e-beam evaporation onto heated substrates, at 200 °C or above. Furthermore, we will demonstrate that the perpendicular magnetic anisotropy of CoPt alloy films can be dramatically enhanced by well (111)-textured Pt underlayers. The key to this success appears to be in controlling the crystallographic orientation of these alloy films such that the CoPt(111) lattice plane is parallel to the film surface. CoPt alloys with wide composition range, e.g., 25–57 at. % Co, have been obtained with saturated perpendicular magnetic remanence, indicating that the perpendicular magnetic anisotropy obtained in these alloy films is not related to the ordered tetragonal Co50Pt50 phase. Further work, however, is needed to clarify the anisotropy mechanism in these CoPt alloy films.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 1791-1795 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Periodic, finely multilayered thin-film magnetic structures (≤200 A(ring)) with high in-plane coercivity suitable for longitudinal recording investigations have been fabricated. CoPt20/Pd and CoPt12Cr17/Pd periodic multilayers can exhibit a perpendicular orientation, originating from surface anisotropy effects, with a magnitude depending on the thickness of the component layers. The perpendicular orientation influences the transition noise, but for the particular systems studied, the results suggest that for a given value of coercivity squareness, (approximately-less-than)0.8, the greatest improvements in media noise performance can be achieved through reduced exchange in films with a well-defined, in-plane orientation.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 1600-1602 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: CoPt alloy films with large perpendicular magnetic anisotropy, perpendicular coercivity, and saturated perpendicular remanence are reported. These films were fabricated by e-beam evaporation at substrate temperatures near 200 °C and above. Well-(111)-textured Pt underlayers are shown to dramatically increase the perpendicular magnetic anisotropy of CoPt alloy films. The large perpendicular magnetic anisotropy is shown to be strongly related to good CoPt(111) texture, and not to the ordered tetragonal Co50Pt50 phase.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 3826-3834 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of low-energy ion bombardment on the structure and properties of zirconia films deposited by reactive ion-beam process is investigated. Bombardment of 100-eV Ar+ during film growth is shown to induce a substantial relaxation of the residual stress as a result of structural modification by the increased mobility of adatoms. Concurrently, the oxygen gettering capability, or film stoichiometry, is improved by the enhanced diffusion of oxygen on substrate surface. The structural change by thermal annealing, up to 600 °C, demonstrates that fine-grained (200–400 A(ring)) cubic zirconia can be stabilized down to room temperature without alloying stabilizers. The impingement of low-energy Ar+ during film growth results in an as-deposited film microstructure which promotes the growth of the cubic-phase crystallites upon post-deposition annealing as well as the texturing of film plane into (111) orientation. The refractive index and optical transmission of the zirconia films are shown to be dependent predominantly upon the oxygen content in the film and less sensitive to the improved atomic packing due to the low-energy Ar+ bombardment.
    Type of Medium: Electronic Resource
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