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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2709-2718 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe absolutely calibrated instrumentation for measuring hard x-ray continuum produced during laser irradiation of ICF targets. The instrumentation includes a crystal spectrograph and two collimated filtered scintillators. The absolutely calibrated crystal spectrograph achieves high sensitivity to x-ray continuum over the energy range of 5 to 35 keV with continuous energy coverage and a resolving power E/ΔE between 20 and 100. Time integrated spectra are recorded and stored electronically on a shot basis using two dimensional charge coupled device (CCD) camera readout of a proximity focused MCP detector close coupled to the x-ray diffracting crystals. The filtered scintillators provide discrete, time-resolved, high energy channels for recording integrated continuum in the 40–60 and 60–90 keV bands. End-to-end calibration of the crystal spectrograph was performed over the design energy interval. We discuss instrument design, calibration, and alignment and the factors affecting sensitivity and resolving power.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2768-2770 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: High-energy background radiation from PBFA II at Sandia National Laboratory introduces uncertainty regarding the effect of background fogging on the sensitivity of the x-ray film at soft x-ray energies. We have performed a calibration to determine how the sensitivity of the Kodak RAR 2492 film is affected by high-energy background radiation. To simulate the background radiation the film was fogged to various densities using a 10 keV bremsstrahlung spectrum. The film was then exposed to soft x-ray emission lines of Al Kα and Ti Kα selected by Bragg reflection from an electron bombardment source. The intensity of the x-ray flux was continuously monitored with a Si(Li) detector to eliminate error due to drift of the x-ray source's intensity. A microdensitometer with matched objectives was used to find the specular density of the exposed film. The results of the calibration are presented in the form of D vs log l for the various densities of the bremmstrahlung prefog exposures.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2862-2870 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The overall performance of both a single- and a double-microchannel plate framing camera were measured. In the case of the double-plated device, only the front plate was gated. A short-pulse, 20-ps full width half-maximum (FWHM), uv laser was used to create photoelectrons on a time scale rapid compared to the temporal variation of the high-voltage gate pulse (965 V peak amplitude and 270 ps FWHM). Measurements were made of the variation in the light output pulse amplitude (8%–24%), width (85–115 ps), and peak location (±22 ps), the latter corresponding to a temporal jitter. It was found that when a dc bias was applied to the plate (in addition to the high-voltage pulse) the output signal increased as the dc bias to the 13 and 5.2 powers, below and above a bias of 450 V, respectively, and a factor of 20 difference in signal between the single- and double-plate cameras. It was also determined that the rejection ratio drops from 500 to 1300 at a bias value of 450 V to 125–190 at 650 V.
    Type of Medium: Electronic Resource
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