Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 683-687 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of αRh2As were grown on top of GaAs (001) in a molecular-beam epitaxy system by codeposition of rhodium and arsenic from separate sources. αRh2As is a good metal with a resistivity equal to 20 μΩ cm, suitable for electronic applications. The holes, the only type of carriers, have a concentration equal to 2.5×1022 cm−3, i.e., a value of the same order of magnitude as that of the best silicides. However, in spite of several features common to αRh2As and GaAs (symmetry, almost equivalent unit-cell constant, and fcc As sublattices), the epitaxial arrangement [100](011)αRh2As//[110](001)GaAs mainly prevails instead of the expected simple unrotated relationship [100](001)αRh2As//[100](001)GaAs. This points out that the achievement of the minimum lattice mismatch is not always the driving force for the epitaxy. In agreement with the ternary phase diagram Rh-Ga-As, the (polycrystalline αRh2As)/GaAs system interacts above 400 °C and leads to the formation of the binary compounds RhGa and RhAs2.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...