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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1553-1556 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A Bragg crystal spectrometer, utilizing a microchannel plate coupled to optical film as the detection medium, has been constructed for use in soft x-ray spectroscopy. The sensitivity of this intensified gated camera to x-rays has been compared directly with standard x-ray film using a calibrated x-ray source. In addition, this high gain, intensified crystal spectrograph (ICS) has been used in an experiment to precisely measure spectral coincidences between x-ray lines in laser-generated plasmas, thus identifying candidates for photoresonant x-ray lasing schemes in the 10–21-A(ring) region. At long wavelengths the ICS was able to obtain useful data on faint lines in a single laser shot, rather than the multiple shots required by an adjacent spectrograph using x-ray film. It also allowed line coincidences to be verified by a new technique utilizing split disk targets. The design and construction of the ICS and results obtained with it are compared with those obtained with standard x-ray film.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2121-2126 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have constructed a high-resolution x-ray image intensifier (XRII) for use in atomic physics. The XRII consists of an alkali halide scintillator crystal coupled by a fiber optic to a proximity focused microchannel plate stack with a bialkali photocathode and wedge and strip readout. The useful area of the detector is 12 cm2. We have measured full width half maximum spatial resolutions at 22 keV of 300 μm and at 122 keV of 600 μm with 0.5-mm-thick and 1.6-mm-thick CsI(Na) crystals, respectively. With NaI(Tl) crystals, x-ray arrival times can be determined with sub-100 ns resolution. In this paper we present the detailed performance of the XRII as well as a brief discussion of the theory of photoelectron limited fast timing.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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