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  • 1
    Electronic Resource
    Electronic Resource
    Optical properties of fluorinated diamond-like carbon films produced by pulsed glow discharge plasma immersion ion processing (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 1456-1459 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pulsed glow discharge plasma from a 1 Pa gas mixture of acetylene (C2H2) and hexafluoroethane (C2F6) was used to produce fluorinated diamond-like carbon (F-DLC) films on glass and polymethyl-methacrylate (PMMA) substrate. The composition of the F-DLC coatings was measured by using Rutherford backscattering spectroscopy and elastic recoil detection analysis techniques. The transmittance, absorption coefficient, and optical band gap of 100 nm thick F-DLC coatings was measured by using an ultraviolet/visible spectrometer. The friction and wear properties were measured with a conventional pin-on-disk device. In addition, contact angle measurements were taken in order to determine the nonwetting properties of the coatings. The results showed an increase in nonwetting properties, transmittance, and optical band gap with increasing fluorine content in the coatings. The increased fluorine contents suppressed the incorporation of hydrogen and increased the optical band gap energy, which is quite different from the general DLC films whose optical properties are highly improved with increasing amount of hydrogen incorporated in the films. Furthermore, the F-DLC coatings on PMMA and glass substrates proved to have low friction and wear and similar nonwetting properties such as Teflon®.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373838
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  • 2
    Electronic Resource
    Electronic Resource
    Modeling the ion energy dependence of the sp3/sp2 bonding ratio in amorphous diamondlike films produced with a mass-separated ion beam (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 5837-5839 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The formation of amorphous diamondlike films by deposition of energetic carbon atoms is modeled. Formation of diamondlike bonding is attributed to transient high pressure created by the ion impact. The relaxation to energetically favored graphitic state is assumed to proceed through succession of metastable states, taking place until the glass transition point is reached. The model illustrates from the new point of view the processes involved in the formation of diamondlike films. It predicts qualitatively similar dependence of film properties on the energy of the incoming carbon atoms as observed in experiments. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359652
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  • 3
    Electronic Resource
    Electronic Resource
    Simulations of sputtering induced roughening and formation of surface topography in deposition of amorphous diamond films with mass separated kiloelectronvolt ion beams (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 6047-6055 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atomic scale simulations are performed for ion bombardment induced roughening of amorphous diamond films in a process where deposition is done by using kiloelectronvolt mass separated ion beams operated in the upper limit of practical deposition energies up to 20 keV. Resulting surfaces are shown to be self-affine and they have low surface roughness. The experimentally observed extremely low roughness is obtained when moderate surface relaxation within the distance of next nearest neighbors is taken into account in simulations. It is found that there is also another mechanism, originating from the ballistic movement of redeposited atoms, which can maintain the eroding surfaces smooth. High-energy, off-normal deposition is shown to lead in pattern formation on a mesoscopic scale. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366472
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  • 4
    Electronic Resource
    Electronic Resource
    Heat capacity of hydrogenated diamond-like carbon films (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 2340-2342 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used differential scanning calorimetry to measure the heat capacity of diamond-like carbon (DLC) film prepared by a plasma immersion ion processing method. The same calorimeter was used to measure the heat capacity of single crystal natural diamond and of high purity graphite. The amount of atomic hydrogen trapped in the DLC films was determined by elastic-recoil-detection spectrometry. The present data and literature values were used to deduce an expression for the specific heat that factors out the contribution from the sp3/sp2 bonding and from the atomic hydrogen trapped in the carbon. The data shows that the hydrogen contribution to the specific heat of carbon is independent of the sp3/sp2 bonding and amounts to about 0.63kB per hydrogen atom. We propose a simple method to determine the sp3/sp2 bonding ratio in hydrogenated DLC films based on measuring the specific heat and the hydrogen content of the sample. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1290387
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  • 5
    Electronic Resource
    Electronic Resource
    Simulations of sputtering induced roughening of amorphous diamond films deposited with mass separated kiloelectronvolt ion beams (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 488-490 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atomic scale simulations are performed for the ion bombardment induced roughening of the amorphous diamond films, when the films are deposited by using kiloelectronvolt mass separated ion beams operated in the upper limit of practical deposition energies up to 20 keV. The results show that the roughness due to sputtering erosion is by a factor of 3 to 4 larger than roughness observed in experiments. The experimentally observed roughness is obtained only when moderate surface relaxation within the distance of next nearest neighbors is included in the simulations. The results suggest that atomic scale relaxation of sputtering induced topography occurs during the deposition. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365844
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    Paper (German National Licenses)
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