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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4146-4149 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the design and performance of a low temperature (1.3–4.2 K) scanning tunneling microscope (STM) setup that can be used in magnetic fields up to 9.5 T. Due to the compact, rigid, and concentric design, the STM is very insensitive to external vibrations. The influence of external magnetic fields on the performance of the STM has been minimized by making a version completely out of titanium (instead of stainless steel). The STM routinely shows atomic resolution on various samples over the whole magnetic field range. We demonstrate the spectroscopic capability by local spectroscopy of the Abrikosov flux lattice on NbSe2. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2863-2866 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An adaptation of the mechanically controllable break junction technique using thin metallic films to create point contacts and tunnel junctions is presented. The junctions that are created using this very simple method are extremely stable, and can easily be adjusted from rather large point contacts (R≈0.1 Ω) to high-resistance (1010 Ω) tunnel junctions. The electrodes can be kept very clean by breaking the sample in ultrahigh vacuum or in a very pure helium atmosphere at 1–4 K. Point-contact spectra of good quality were measured for contacts of 0.1–500 Ω. For very small contacts, the expected steplike increase of junction resistance with decreasing contact size was observed, with a jump to tunneling behavior occurring at resistances of 12–14 kΩ. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1316-1320 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have constructed a double point-contact system for use at liquid-helium temperatures which is adjustable from the outside. Both point-contact wires can be independently displaced vertically with a travel of 5 mm and horizontally with a travel of 4 mm. Displacements of 5 μm can be achieved. The sample table is rotatable over 360° and can be translated over 2 mm, which implies that point-contact wires can be placed at any desired position of a sample. Moreover, the point-contact wires and the sample can be viewed from the outside to check positions and a magnetic field up to 1.2 T can be applied. The point contacts obtained with this system are both mechanically and electrically stable, also in a magnetic field. The instrument is of great use for transverse electron focusing studies of transport properties of metals, surfaces, and interfaces. Because of versatility, the instrument is also suitable for single point-contact experiments to study interfaces of normal metals and superconductors or to perform point-contact spectroscopy experiments.
    Type of Medium: Electronic Resource
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