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  • 1
    Electronic Resource
    Electronic Resource
    Electron-beam-induced current decay measurements in electron probe instruments using a multichannel analyzer (1985)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 2 (1985), S. 509-511 
    Details
    ISSN: 0741-0581
    Keywords: Decay measurements ; Electron-beam-induced current ; Hydrogenated amorphous silicon ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A simple method for decay measurements of the charge collection mode (commonly referred to as electron-beam-induced current or EBIC) of an electron probe instrument is presented. The decay, which occurs at continuous electron irradiation, should be distinguished from a decay measurement due to the electron beam blanking. This method could be applied to other modes of an electron probe instrument, e.g., cathodoluminescence, in studying electron-beam-sensitive semiconductors. An example of the decay of the EBIC signal in a hydrogenated amorphous silicon device is presented.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060020513
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Cathodoluminescence attachment to an electron probe instrument (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 343-346 
    Details
    ISSN: 0741-0581
    Keywords: Cathodoluminescence ; GaAs ; InP ; ZnS ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A simple cathodoluminescence (CL) attachment to a JEOL JSM-840 scanning electron microscope (SEM) is described. It is based on a Si photodiode mounted inside the SEM chamber. The current amplifier of a backscattered electron detector unit, which is a standard feature of this SEM, is used to amplify and display the CL images. Examples of CL panchromatic (integral) images of GaAs, InP, and ZnS crystals are presented.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030306
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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