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  • 1
    Electronic Resource
    Electronic Resource
    Superconductor-normal-superconductor behavior of Josephson junctions scribed in Y1Ba2Cu3O7−δ by a high-brightness electron source (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 3811-3813 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a substantial improvement in the behavior of Josephson junctions scribed in Y1Ba2Cu3O7−δ films using a high-brightness field-emission electron gun source instead of a lower-brightness thermionic source. These junctions exhibit resistively shunted junction behavior over the entire temperature range from the coupling temperature to at least 4 K, a temperature window which can be larger than 55 K. Superconductor-normal-superconductor character is indicated by the exponential dependence of the critical current on temperature for all temperatures below 90 K. The data demonstrate that electron irradiation under these conditions produces a modified region which is completely normal above 4 K and is narrower in width than previously obtained. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.116625
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  • 2
    Electronic Resource
    Electronic Resource
    Critical-current measurements in planar Josephson junctions (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 3010-3012 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The properties of planar high-temperature superconducting Josephson junctions are not entirely consistent with low Tc models. Some of these disparities may be intrinsic, related to the unusual superconducting properties of the electrodes, while others are due to the nonstandard planar geometry. By comparing experimental measurements of a 24° bicrystal substrate Josephson junction with a simple model of nonuniform current flow in a planar geometry, we show that several unusual properties can be explained as extrinsic. We show that nonuniform current feed in a planar geometry leads to a reduced critical current, an unchanged Meissner field Hco, and a power-law dependence of the critical current on Hco different from that expected in an overlap geometry. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120246
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  • 3
    Electronic Resource
    Electronic Resource
    Flux penetration in bicrystal-substrate thin-film YBa2Cu3O7−δ Josephson junctions (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 517-519 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We experimentally investigate the effect of flux penetration into the electrodes of a thin-film YBa2Cu3O7−δ grain boundary Josephson junction using the field-dependent critical current as a probe. Above a temperature-dependent threshold field for flux trapping we observe that the maximum critical current Icmax is reduced, and occurs at an applied field Hpeak shifted from zero. The critical current also has an increasingly complex field-dependent structure. Despite this complexity, we experimentally find that Icmax follows a simple power law Hpeak−0.30. We present a model that predicts Icmax∝Hpeak−1/3 due to fluxons trapped in the electrodes. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118197
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  • 4
    Electronic Resource
    Electronic Resource
    Observation of strong to Josephson-coupled crossover in 10° YBa2Cu3Ox bicrystal junctions (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 3171-3173 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A temperature-dependent strong to weak (Josephson) coupling crossover near 75 K is observed for 10° misorientation YBa2Cu3Ox grain boundaries. Below 75 K the current–voltage characteristic (IVC) shows strongly coupled, flux-flow behavior. Above 75 K, the IVC is Josephson coupled. The data are consistent with a network of microbridges at the grain boundary defined by dislocation strain fields. The data are compared to recent calculations by A. Gurevich and A. E. Pashitskii [Phys. Rev. B 57, 13878 (1998)]. The characteristic voltages for these low-angle grain boundaries are higher than high-angle boundaries at 77 K, and could lead to improved high-temperature superconducting device operation in this temperature range. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125267
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    Paper (German National Licenses)
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