ISSN:
1573-8663
Keywords:
Bi4Ti3O12
;
LaAlO3
;
epitaxial relationship
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Bismuth titanate Bi4Ti3O12 thin films were prepared on LaAlO3(012) substrates by a spin coating-pyrolysis process using metal naphthenates as starting materials. The c-axis oriented Bi4Ti3O12 thin films, which contained no second phases as θ–2θ scans, were obtained by heat-treatment in air at temperatures of 600°C and above. X-ray diffraction pole-figure analysis showed that the Bi4Ti3O12 thin film has an epitaxial relationship with the LaAlO3 substrate.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1009993804582
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