Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
87 (2000), S. 6863-6865
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Compositional segregation structures of Co–Cr–Ta, Co–Cr–Pt, and Co–Cr–Pt–Ta thin film media with Cr concentrations of about 15 at. % were studied using an analytical transmission electron microscope. Cr atoms in the CoCrTa specimen are extremely localized around the grain boundaries with a maximum concentration of about 23 at. % with a width of 1 nm, while that inside the grain is about a half of the average composition. The Co–Cr–Pt specimen shows Cr segregation at grain boundaries with a maximum concentration by 4 at. % greater than the average composition. The Cr concentration inside the grain is kept nearly same with the average concentration. The Co–Cr–Pt–Ta specimen shows a degree of Cr segregation between the Co–Cr–Ta and the Co–Cr–Pt systems. The Cr enrichment at bicrystal grain boundaries is broader and weaker than those at the normal grain boundaries. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.372867
Permalink
Library |
Location |
Call Number |
Volume/Issue/Year |
Availability |