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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 2475-2478 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A microforce sensor with a force feedback method for scanning force microscopy is presented. The force sensor is constructed by using an optical fiber and a microcantilever. The facet of the optical fiber is coated with a gold thin film 15 Å thick. This gold film acts not only as a partially reflected mirror but also as an electrode of the electrostatic actuator. The interaction force between a probe tip and a sample is balanced by the electrostatic force. The deflection of the cantilever is measured by an interferometer consisting of the facet of the optical fiber and the cantilever surface. We have made the force sensor and measured some force curves of a mica surface with a SiN probe tip. The force curves obtained by this sensor are quite different from the curves by a conventional measurement without a feedback system. The force resolution of the system is 10−10 N with a bandwidth of dc∼1 kHz. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2140-2146 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A pump-probe picosecond time-resolved Raman spectrometer has been constructed using a dye laser synchronously pumped by a cw mode-locked Nd:YAG laser and a high repetition rate (2 kHz) dye amplifier pumped by the frequency doubled output from a cw Nd:YAG regenerative amplifier. Transform-limited picosecond pulses with 3.5 cm−1 wave number width and 3.2 ps temporal width are obtained at the wavelength of 588 nm. The second harmonic of these pulses is generated at 294 nm and is used for pumping, while the remaining visible pulses are used for probing resonance Raman scattering. The cross-correlation time between the pump and probe pulses is 4.1 ps. The temporal profile of the laser pulse is found to be very close to the sech2 shape. The wave number resolution of the system is estimated to be 3.5 cm−1 according to the Tailor criterion. The time resolution is estimated to be 2.2 ps using a criterion newly proposed in the present paper. Time-resolved Raman spectra of S1 trans-stilbene and S1 p-terphenyl are presented to demonstrate the capability of the constructed spectrometer.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5532-5536 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Scanning force microscopes (SFMs) are sometimes used to obtain a force curve, which shows the force variation as a function of tip–sample distance. In the force curve measurement, if the spring constant of the force detecting lever is small, the measured force curve has discontinuity and is different from the true force curve. In this paper, we present a new type of force balancing force sensor built in SFM. This force sensor employs an optical lever for detecting the rotation of the lever and two electrostatic force actuators with transparent electrodes. This sensor has two operating modes; with and without feedback. In the feedback mode, the force detecting lever is balanced with the electrostatic force. This system has the effect of enlarging the effective spring constant of the whole sensor. In the nonfeedback mode, this sensor acts as an ordinary force sensor. By using this sensor in both modes we will show the effectiveness of the force feedback in force curve measurements. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 87-90 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An atomic force microscope has been constructed which enables us to observe sample surfaces through a metallurgical optical microscope. The cantilever deflection is detected by a polarization common-path interferometer with optical heterodyne technique. The optical system of the interferometer is incorporated in the commercial optical microscope. The common-path interferometer is rather insensitive to the effects of environmental disturbance such as thermal drift and mechanical vibration. The sample surface and the cantilever are observed by a microscopic objective of ×20. We can adjust the interferometer easily by observing both the cantilever and laser beams. The detection system has a total rms noise of 0.35 A(ring) in a frequency bandwidth of 0.5–200 Hz on a free Si3N4 cantilever of 0.1 N/m spring constant. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 96 (1992), S. 10219-10224 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 96 (1992), S. 8956-8961 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Optical review 7 (2000), S. 415-419 
    ISSN: 1349-9432
    Keywords: computed tomography ; shearing interferometer ; refractive index distribution ; flow field ; double-period grating
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A system of interferometric computed tomography (CT) for measuring temporal variation of refractive index distribution in a transparent medium such as a flow field has been developed. The system adopts shearing interferometers with double-period diffraction gratings to obtain path-length differences between sheared rays. In order to obtain projection images simultaneously six shearing interferometers are placed in six different directions. The image data for the six interferometers are stored in image memories at the rate of 30 frames per second. Refractive index distribution in the sectional plane of the flow field is calculated with the data using the algorithm of CT modified for shearing interferometers. In experiments temporal variations of refractive index distributions due to a flame and gas flow from a nozzle are measured. These experiments verified that the shearing interferometers are suitable for interferometric computed tomography because they are simple in arrangement and insensitive to disturbances such as mechanical vibration. Potential of the shearing technique and comparison between the CT with the shearing type of interferometer and that with another type of wavefront sensor are discussed.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Optical review 4 (1997), S. 588-592 
    ISSN: 1349-9432
    Keywords: phase-shifting method ; speckle interferometer ; phase measurement ; statistical property of speckle ; quantization error
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A method for accurately measuring information about the deformation of a rough surface object using a phase-shifting speckle interferometer with a television camera and a computer is considered. In this case, the intensity change of the speckle by phase-shifting varies randomly in space because of the statistical property of the speckle. Then, at points with small intensity change, the accuracy of the phase measurement is affected significantly by the quantization error of an analog to digital converter for data recording. To improve the accuracy, the statistical property of the interference speckle must be clarified. This is done theoretically and experimentally, and the experimental results show that higher measurement accuracy can be attained by selecting large amplitude points.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Optical review 2 (1995), S. 92-99 
    ISSN: 1349-9432
    Keywords: artificial refractive index ; effective medium theory ; effective refractive index ; diffraction grating ; subwavelength grating
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract In the recent researches of subwavelength relief gratings, the effective refractive indices are used for calculating the coefficients of reflection and transmission of light waves. The effective refractive indices are given by the effective medium theory for light waves propagating in a bulky stratified medium. This paper describes the ability and limitation of the theory applied to estimate the performance of such subwavelength gratings. The limitation is revealed by numerical calculations using a rigorous electromagnetic grating theory and the effective medium theory. As a result, an understanding of the wave behavior in the subwavelength grating has been acquired, which explains the limitation of the effective medium theory.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Optical review 7 (2000), S. 561-565 
    ISSN: 1349-9432
    Keywords: X-ray interferometer ; shearing interferometer ; phase shifting ; X-ray imaging ; X-ray line source
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An X-ray shearing interferometer with a line source is presented. The line source broadens X-ray beams and enables us to obtain a phase image with an X-ray image sensor without mechanical scanning. It can reduce the measuring time compared with image acquisition by mechanical scanning. Small phase difference is measured with the phase shift method using acrylic wedges. Although the output beam is overlapped with the non-interfering beams, we can obtain interference fringes with reasonable contrast. With this system we can obtain a projected phase image of an acrylic plate with cellophane tape.
    Type of Medium: Electronic Resource
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