Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
70 (1999), S. 3886-3888
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A design of an electron gun system is presented whose stray light emission is reduced by about three orders of magnitude compared to a regular low-energy electron diffraction gun. This is achieved by a combination of a BaO cathode run at rather low temperature and a 30° tandem parallel-plate analyzer used as an optical baffle. The system provides a high beam current of several microampers at 50 eV beam energy. The system can be used down to ∼10 eV. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150007
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