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  • 1
    Electronic Resource
    Electronic Resource
    Chemisorption of CO on NbC(111) at 80 K: Angle-resolved photoemission study (1992)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 96 (1992), S. 842-847 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Angle-resolved photoemission spectroscopy with synchrotron radiation has been used to study the adsorption of CO on a NbC(111) surface at 80 K. CO is adsorbed molecularly on the NbC(111) surface. Binding energies of the CO valence levels are in good agreement with previously published results for metal–CO systems. The adsorbed CO forms a (1×1) overlayer. The two-dimensional band dispersions of CO valence levels in the (1×1) phase are measured in the Γ¯M¯ direction. The considerable dispersions (∼0.35 eV for both 4σ and 5σ+1π levels) are observed as in the case for the periodic CO layer on the metal surfaces. A shape resonance of the 4σ level of the adsorbed CO is observed at ∼32 eV, which is nearly the same energy as that for the gas phase CO. The 4σ cross section at the resonance energy is measured as a function of incidence angles and the result is consistent with a molecular orientation normal to the surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.462470
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A 2-m grazing incidence monochromator with a silicon-carbide-based master grating for undulator radiation : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1305-1308 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Performance of a 2-m grazing incidence vacuum ultraviolet (VUV)/soft x-ray monochromator was evaluated with silicon-carbide-based master grating of 1200 lines/mm groove density that was newly developed for use of undulator radiation. Incident power density on the grating surface was as high as 120 mW/mm2. Surface observation of the grating after the test operation showed that the periodic structure and reflective surface of the grooves were well preserved, except for slight degradation of the groove edges, even though no active cooling system was equipped. Photon flux was of the order of 1012 photons/s. Efficiency of second-order diffraction relative to the first-order diffraction was 20%–50%. Resolving power of 2200 was achieved at 244.4 eV for 5-μm exit slit width.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143053
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Undulator-radiation-excited x-ray fluorescence analysis system for light elements (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 5597-5601 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An undulator-radiation-excited x-ray fluorescence analysis system for light elements has been developed and tested on the 26-period multipole wiggler/undulator beamline at the Photon Factory. An entrance-slitless optics with a variable-spacing grating was devised for a fluorescent x-ray dispersion system to achieve spectroscopic analysis with high efficiency and high resolution. Both soft x-ray emission (SXE) spectra and x-ray absorption near-edge structure (XANES) spectra with fluorescent x-ray detection were obtained by this system, taking advantage of the high brightness and quasimonochromatic character of the incident undulator beam. The analysis system was evaluated by measuring the B Kα SXE and fluorescence XANES spectra of B, BN, and B2O3.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143388
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  • 4
    Electronic Resource
    Electronic Resource
    Photoelectron intensity oscillation during chemical vapor deposition on Si(100) surface with Si2H6 (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 2013-2015 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have found that the photoelectron intensity of the dimer-dangling-bond-derived surface state on Si(100) shows a periodic oscillation during chemical vapor deposition with Si2H6 gas. The substrate temperature and Si2H6-pressure dependence of the oscillation period was measured. By use of a selective-growth method using SiO2-patterned wafers, one oscillation period was clarified to correspond to the Si growth of one atomic layer of the Si(100) plane with a thickness of 1.36 A(ring).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111723
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Development of a three-electrode-lens drift tube for time-of-flight mass spectrometry (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 612-614 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A three-electrode-lens drift tube for time-of-flight mass spectrometry (TOF-MS) has been developed for utilizing a detector to observe photon-stimulated desorption (PSD). In spite of a small detection area, the detector has a high detection efficiency and durability to reactive gas atmosphere at high pressure. The TOF-MS performance of the drift tube was examined for PSD using single-bunch-mode synchrotron radiation on a dichlorosilane (SiH2Cl2)-saturated Si(001) surface. The measured acceleration and focusing-voltage dependences of the time of flight, intensity and full width at half-maximum for the peak of H+ and Cl+ PSD ions are discussed in terms of the numerical calculations of ion trajectories and focusing characteristic of the drift tube.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049597019390
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Internal flow mechanism in filter cakes (1969)
    Hoboken, NJ : Wiley-Blackwell
    AIChE Journal 15 (1969), S. 405-409 
    Details
    ISSN: 0001-1541
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Notes: The definition of filtration resistance is modified by considering relative solid-liquid velocity.The internal flow mechanism in a filter cake is reexamined in view of the movement of solids during compression. Under conditions of short filtrations involving highly concentrated slurries, the velocity of solids is shown to be comparable to the velocity of the liquid. A differential equation is proposed for the flow through compressible cakes in which the pressure gradient is assumed proportional to the difference in average velocities of the liquid and solid rather than to the average velocity of the liquid alone.An improved definition of the average filtration resistance is developed on the basis of the new flow equation.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/aic.690150320
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