Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
77 (2000), S. 3615-3617
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10−17 F) electrically isolated metallic dot on the scanning probe tip. The methods for dot fabrication, charging, and discharging are described and electron tunneling to a sample surface is demonstrated. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1330568
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