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  • 1
    Electronic Resource
    Electronic Resource
    Origin of unknown x-ray diffraction peaks from incommensurate superlattices (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 423-425 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Unexpected x-ray diffraction peaks have been observed in some thin film modulated structures in which each constituent element has a nonintegral number of atomic layers. The origin of these peaks has not been clearly identified. The positions and intensities of these peaks were analyzed by numerical calculation from a model superlattice. The results indicate that the positions of the anomalous peaks are caused by a new long range periodicity due to the nonintegral number of atomic layers of each constituent element and that the intensities of the anomalous peaks are determined by the interfacial structure between the two different kinds of atomic layers. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359346
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Photoelectron bremsstrahlung spectrum in synchrotron radiation excited total reflection x-ray fluorescence analysis of silicon wafers (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 902-908 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: When synchrotron radiation is used as an excitation source, the total reflection x-ray fluorescence analysis of surface contamination on silicon wafer has an extremely low background intensity that determines the minimum detection limit. In this article, the background spectrum originating from the photoelectron bremsstrahlung is calculated using the Monte Carlo method. The doubly differential electron bremsstrahlung cross sections obtained from the Born approximation modified by the Elwert factor and with the use of the form factor approach for screening are used instead of empirical formulas. In addition to the bremsstrahlung spectrum produced from the silicon wafer, the bremsstrahlung intensity that photoelectrons, which escape from the silicon wafer, produce in the filter attached to the detector is also calculated in accordance with the usual synchrotron radiation excited total reflection x-ray fluorescence experimental conditions. The calculated photoelectron bremsstrahlung spectra are compared with experimental results and the conditions for a lower minimum detection limit are discussed. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370821
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  • 3
    Electronic Resource
    Electronic Resource
    Interface structure and magnetic anisotropy of a Co/Pt multilayer (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4205-4209 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Co/Pt multilayer with strong perpendicular magnetic anisotropy was prepared by electron beam evaporation. Using polarized extended x-ray absorption fine structure (EXAFS) measurements at the Co K edge, the interface structure of the Co/Pt multilayer was investigated. In quantitative analysis, the EXAFS data measured with in-plane polarization showed considerable intermixing at the Co/Pt interfaces, while those measured with out-of-plane polarization indicated an abrupt interface structure. More detailed atomic configurations of the Co/Pt interface were simulated using the measured coordination numbers. The results of the computer simulation showed that the Pt clusters in Co layers and the Co clusters in Pt layers were interfacing. With the obtained structural information and a symmetry-based Néel model, the magnetic anisotropy of the multilayer was estimated. The estimated magnetic anisotropy was consistent with the measured one. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373053
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  • 4
    Electronic Resource
    Electronic Resource
    Evolution of the mound morphology in (111) oriented polycrystalline Pd films and Co/Pd multilayered films with Pd underlayers (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 306-310 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pd thin films and Co/Pd multilayered films with progressively thicker Pd underlayers are prepared by physical vapor depositions. Their growth behaviors are investigated using atomic force microscopy and transmission electron microscopy. We observed that a mound occurs on top of each crystallite of (111) oriented polycrystalline Pd films and that the average mound size increases according to the capillary-induced coalescence mechanism. We attribute this observed growth instability to the step barrier which resists step-down diffusion of deposited atoms. We also observed that the mound slopes of Co/Pd multilayers are smaller than those of their Pd underlayers. We suggest that this results from a downhill current driven by the interface energy between the Co and Pd layers. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370729
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  • 5
    Electronic Resource
    Electronic Resource
    Dependence of the magnetic properties of Co/Pd multilayered films on the structural parameters estimated accurately by x-ray diffraction (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4986-4988 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this study, Co/Pd multilayered films with a few atomic layers of Co were prepared by alternating deposition in an ultrahigh-vacuum physical-vapor-deposition system. The structural parameters were estimated accurately making use of only the angular positions of x-ray diffraction peaks. The magnetic properties were found to vary greatly depending on Pd predeposition and Pd-sublayer thicknesses as well as Co-sublayer thickness. The Pd-predeposited films were found to have a remarkably high coercivity of 4723 Oe and a greatly enhanced interfacial magnetic anisotropy of 0.72 mJ/m2, which indicates an excellent potential as a magneto-optical recording medium.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352021
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  • 6
    Electronic Resource
    Electronic Resource
    A structural characterization of AlN thin film deposited on a single crystal Al2O3(0 0 0 1) substrate (1997)
    Springer
    Journal of materials science 16 (1997), S. 1457-1459 
    Details
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1018542217877
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