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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 3307-3314 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A combined photon scanning tunneling and shear-force microscope has been developed to investigate the optical field distribution in a planar waveguide splitter and a multibranch mode mixer. The optical intensity distribution just above the surface of a planar waveguide is mapped with subwavelength resolution by a tapered optical fiber that probes the evanescent field. Simultaneously, the topography of the waveguide is recorded with subnanometer accuracy using a constant-distance feedback system based on shear-force detection with a tuning fork sensor. The experimental field patterns are quantitatively compared with field patterns simulated with the two-dimensional finite difference beam propagation method and a−mode solver. Good quantitative agreement between experiment and simulation is obtained. Moreover, the experiment reveals several details in the field distribution that results from incoupling conditions, mask imperfections, waveguide edges, and surface roughness. The surface effects in the optical field distribution are introduced by the use of the constant-distance feedback system. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 142-144 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 910-912 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The gradual transformation of a guided TM00 mode into an "intermediate" double mode by a splitting junction has been investigated with a phase-sensitive photon scanning tunneling microscope. Field profiles and wave vectors of the modes have been directly determined from the phase information. Via a Fourier analysis of the measured phase and amplitude maps the decay of the TM00 mode and buildup of the intermediate mode have been directly visualized. Phase singularities and phase jumps in the transition region underline the mode transformation process. Finally, a partial polarization conversion of the TM modes to TE-polarized modes has been observed. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 4092-4094 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A photon scanning tunneling microscope with a three-dimensional multiheight mode has been developed for the mapping of optical field distributions in integrated optical waveguide structures. The optical field is measured at different heights above the waveguide surface. The multiheight measurements also contain the optical information gathered with the commonly used constant gap measurements in addition to the topography of the waveguide surface. With the multiheight method, the decay length of the evanescent field is readily determined as function of the in-plane coordinate. Moreover, the evanescent light can be distinguished from scattered light. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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