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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 6392-6399 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Observations on kink bands in lamellar diblock copolymers (SEP 40–70), caused by unidirectional or oscillatory shear strain, are interpreted in terms of the low-energy structure (LES) hypothesis, to wit: "In a material subject to mechanical stresses, that structure will be approached which has the lowest free energy among all structures which are in equilibrium with the tractions and are accessible to the system." This is the generalization of the low-energy dislocation structure (LEDS) hypothesis applicable to dislocation structures in crystalline materials. In agreement with the LES hypothesis, moderate fatigue cycling of initially disordered material establishes an order such that the plane of the lamellae is parallel to the plane of shear stress application, being the orientation of lowest shear modulus and, hence, for fixed fatigue amplitude, of lowest strain energy. At fatigue strain amplitudes above about 40% the material develops kink bands on account of the compressive stress along the body diagonal of the samples. The geometry of these kink bands shows that the plane parallel to the lamellae serves as preferred slip plane with the lowest resistance against sliding among all possible directions. Also the kink band morphology conforms with the LES hypothesis. Specifically, on average the ratio of kink band length (L) to the square of kink band width (W), i.e., L/W2, is nearly constant as expected from the minimization of kink band boundary energy and the elastic strain energy on account of the strain discontinuity at the ends of the bands. Subsequent experiments on a different copolymer in a range of temperatures additionally verify the LES hypothesis through establishing that, throughout, large-amplitude cycling causes the lamella orientation of lowest shear modulus. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 72 (1968), S. 4150-4154 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 331-337 (May 2000), p. 689-702 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Naturwissenschaften 46 (1959), S. 334-335 
    ISSN: 1432-1904
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Chemistry and Pharmacology , Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Naturwissenschaften 38 (1951), S. 502-502 
    ISSN: 1432-1904
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Chemistry and Pharmacology , Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Materials research innovations 1 (1997), S. 169-179 
    ISSN: 1433-075X
    Keywords: Keywords Composites ; Metal composites ; Microtomy ; Sample preparation ; TEM samples ; Ultra-microtomy
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract  Two variations of a new method of TEM metal sample preparation are proposed, hereby labeled RUM1 and RUM2, for ”reverse ultra-microtomy” 1 and 2, respectively. With these techniques, the TEM samples are formed from bulk specimens by successively slicing off layers, with an ultra-microtome, until the remnant is partially thinned to electron transparency. This requires the sample to be embedded with excellent adhesion in a mounting material whose mechanical properties resemble that of the sample. While these methods are by far slower than ordinary microtomy wherein the individual slices are used as samples, preparation times are comparable to those for creating TEM samples by standard techniques. Furthermore, the methods (i) can be used where electropolishing fails, (ii) can be favorably applied to finely layered materials and composites, (iii) permit studies of near-surface structure gradients, and (iv) permit the simultaneous observation of an original surface and the underlying material. The methods have been successfully demonstrated through comparisons between samples created through RUM1 and 2 and standard TEM samples. Artifacts caused by the new method of reverse microtoming are shown to be very much reduced compared to direct microtoming.
    Type of Medium: Electronic Resource
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