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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2027-2029 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Low-energy ion scattering spectrometry (LEISS) and x-ray photoelectron spectroscopy (XPS) have been employed to quantify in situ the near-surface composition of strained Si1−xGex epitaxial thin films grown on Si(100) substrates using GeH4 and Si2H6 as sources. The use of LEISS reveals the Ge concentration in essentially the first monolayer, whereas XPS is sensitive to several monolayers. We find that the extent of Ge surface segregation implied by each technique follows the trend: LEISS-Ge%(very-much-greater-than)XPS-Ge%(very-much-greater-than)bulk-Ge%. A two-site model (involving surface and bulk states) cannot account for both the XPS and LEISS results, rather a model invoking Ge enrichment in the subsurface layers is required to explain the data. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 2181-2183 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present here a low-temperature (Ts〈630 °C) process for the selective epitaxial growth of Si that employs atomic hydrogen. Modulation of both the substrate temperature and the flux of atomic hydrogen gives alternating growth and suppression/etching cycles, resulting in a significant increase in selectivity. Epitaxial thin-film quality is essentially unaffected, as verified by in situ analysis via low-energy electron diffraction, and ex situ analysis via scanning electron and atomic-force microscopy. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 817-819 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recent experimental results concerning Ge segregation in Si1−xGex epitaxial thin films deposited on Si(100) substrates using Si2H6 and GeH4 cannot be accounted for by a simple two-site model involving surface and bulk states. This is due to Ge enrichment in the subsurface layers. Here, we demonstrate that a simple model based on the regular solution theory, which invokes both nearest, and next-nearest neighbor interactions, can explain the Ge enrichment in the subsurface. A computer simulation using the Monte Carlo method verifies the assumptions made in the model, and both methods show excellent agreement with the experimental data. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 7140-7151 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The reaction probabilities of GeH4 and Ge2H6 on the Ge(100) and Ge(111) surfaces have been measured as a function of substrate temperature, incident kinetic energy, and angle of incidence employing supersonic molecular beam scattering techniques. At sufficiently large incident kinetic energies (Ei(approximately-greater-than)1 eV) both GeH4 and Ge2H6 react by direct dissociative chemisorption on both surfaces examined, with the reaction probability increasing approximately exponentially with increasing (scaled) incident kinetic energy. At moderate kinetic energies (Ei∼0.4 eV), however, Ge2H6 reacts by a precursor-mediated mechanism on Ge(100), as demonstrated by a decrease in the reaction probability with either increasing substrate temperature or incident kinetic energy. Interestingly, under similar conditions, no evidence is found for precursor-mediated adsorption of Ge2H6 on the Ge(111) surface. The reaction of Ge2H6 does not exhibit a GeH4 production channel on either Ge(100) or Ge(111) for the conditions examined here. The results obtained at high incident kinetic energies ((approximately-greater-than)1 eV) are well described by a statistical model based upon a Rice–Ramsperger–Kassel–Marcus (RRKM) framework. The moderate incident kinetic energy results for Ge2H6 on Ge(100) are well described by a model that assumes reaction via a trapping, precursor-mediated mechanism. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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