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  • 1
    Electronic Resource
    Electronic Resource
    Time and orientation dependence of ordering in anodized aluminum for self-organized magnetic arrays (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4721-4723 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Anodization experiments to create alumina pores were performed using pure Al and hard disk Al–Mg substrates. A single step anodization was employed for up to 40 h to determine the time dependence of pore ordering. The pores formed from the Al–Mg substrate were unordered, while ordered-pore domains as large as 3 μm form in both the as-rolled and annealed pure Al samples. The effect of the aluminum grain crystallographic orientation was investigated via orientation-imaging microscopy for the pure Al surface with both order and disordered pores. It was found that neither heat treatment nor crystallographic orientation played a large role in the pore ordering. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373138
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  • 2
    Electronic Resource
    Electronic Resource
    High coercivity CoCrPt films achieved by post-deposition rapid thermal annealing (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6869-6871 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Post-deposition rapid thermal annealing (RTA) was performed on multilayered films consisting of a Mn capping layer on top of CoCrPt/CrTi/NiAl. High coercivities were achieved even at low Mrt values and coercivity values increased more than that would have been predicted by the decrease in magnetization values. This is most likely due to the significant decrease in intergranular exchange coupling, as shown by the δM measurement. Transmission electron microscopy characterization indicates no apparent grain growth and no visible improvement in CoCrPt crystallographic texture after RTA. It is believed that the preferential diffusion of Mn into CoCrPt grain boundaries promotes magnetic grain isolation. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372869
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  • 3
    Electronic Resource
    Electronic Resource
    New highly oriented soft magnetic underlayer structures for perpendicular recording (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6355-6357 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Highly oriented soft underlayers with face-centered-cubic (fcc) phase Co, Co alloy, and composite NiFe/Co film structures have been epitaxially grown on single crystal Si wafers by sputter deposition. The epitaxial orientation relationships have been determined by x-ray diffraction and transmission electron microscopy. It was found that the soft underlayer magnetic properties can be modified in a wide range by fine tuning the Co alloy composition or the Co alloy thickness in a NiFe/Co structure. Ti films were sputter deposited on top of the NiFe and Co layers and epitaxial growth in both Ti(0001)/Co(111) and Ti(0001)/NiFe(111) was observed. Through this highly oriented Ti intermediate layer, a Co alloy perpendicular media layer with greatly improved hexagonal-close-packed (0001) orientation can be integrated with the highly (111) textured fcc soft magnetic underlayers. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372704
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  • 4
    Electronic Resource
    Electronic Resource
    Dependence of Co anisotropy constants on temperature, processing, and underlayer (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6884-6886 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dependence of the Co anisotropy constants on the measurement temperature, deposition conditions, and underlayer materials was studied using unicrystal Co(101¯0)/Cr (or NiAl)(112)/Ag(110) films sputter deposited on hydrofluoric acid etched Si(110) substrates. The single, in-plane easy axis orientation in these films allows the direct determination of the anisotropy constants. The anisotropy constants of unicrystal Co films are smaller than those of a bulk Co single crystal, and the temperature dependence of the anisotropy constants is stronger. The K1 value drops by 50% as the temperature is increased from 25 °C to 75 °C, and then becomes negative at 135 °C. This zero-crossing temperature is considerably lower than the 250 °C at which K1 of a bulk Co single crystal decreases to zero. The anisotropy constants also vary with the film preparation substrate temperature. Applying a substrate bias during the Co deposition effectively increases K1 to near bulk material values. Unicrystal Co films grown on NiAl/Ag/HF–Si(110) show smaller K1 as compared to those on Cr underlayers. The addition of a thin Cr intermediate layer on the NiAl underlayer, however, restores K1 to the larger value obtained on Cr/Ag/HF–Si(110). © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372874
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  • 5
    Electronic Resource
    Electronic Resource
    Growth of CoCrTa(112¯0)-oriented thin films on a D03 Mn3Si(002) underlayer (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6698-6700 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Mn3Si possesses a D03 structure, which is a bcc derivative structure with nearly the same atomic spacing as Cr and NiAl which have been commonly used for longitudinal magnetic recording underlayers. AG(30 nm)/CoCrTa(40 nm)/Mn3Si(x, x=100, 200, 400 nm)/Ag(75 nm) thin films were sputter deposited onto hydrofluoric acid (HF)-etched Si:(001) substrates at elevated temperature. Compared to the 100 and 200 nm thick Mn3Si samples, the XRD spectrum of the 400 nm thick Mn3Si sample shows a significant increase in the intensity of the Mn3Si(002) peak. This suggests that a high volume fraction of the D03 phase was formed. The CoCrTa(112¯0) peak intensity has been found to increase with Mn3Si thickness. As a result, the in-plane coercivity increases as the volume fraction of the D03 phase increases. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372812
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  • 6
    Electronic Resource
    Electronic Resource
    Highly oriented NiFe soft magnetic films on Si substrates (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 5750-5752 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Highly oriented NiFe thin films have been produced via sputter deposition on HF etched Si substrates. Cu and Ag are used as underlayers to induce the epitaxial growth of NiFe films. The orientation relationships between NiFe, Cu, Ag, and Si have been determined by x-ray diffraction measurements and transmission electron microscopy. Magnetic properties have also been characterized. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370114
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  • 7
    Electronic Resource
    Electronic Resource
    Microstructure and magnetic properties of CoCrPt/Cr films on ultrasmooth NiP/AlMg substrates : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5348-5350 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Investigation of the correlation between the microstructure and magnetic properties of Co68Cr20Pt12/Cr thin films which were sputter deposited under different conditions onto 95 mm ultrasmooth NiP/AlMg disk substrates (Ra∼2 A(ring)) has been carried out. Grain morphology characteristics of the films and disk surface roughness were studied by transmission electron microscopy (TEM) and by atomic force microscopy. Tilted-specimen electron diffraction patterns were used to determine the crystallographic texture of the films. The low coercivity of the disks deposited at 100 °C preheated substrates is attributed to the randomly oriented grains of the CoCrPt/Cr layers. Enhancement of the coercivity of the disks deposited on 220 °C preheated substrates is thought to be mainly due to the (112¯0)CoCrPt/(002)Cr crystallographic texture and uniformly distributed grains which are equiaxed in shape. The strength of the (112¯0)CoCrPt/(002)Cr texture can be modified by the Ar gas pressure during the deposition of the Cr underlayer. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361373
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  • 8
    Electronic Resource
    Electronic Resource
    Seed layer induced (002) crystallographic texture in NiAl underlayers : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4902-4904 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic properties of Co alloy thin films are strongly dependent on their crystallographic texture and microstructure which in turn can be controlled by the texture of the underlayer. For Co alloy longitudinal recording media with Cr underlayers, it is desirable to have (002) textured Cr underlayers. Since NiAl has the B2 structure and has a lattice constant similar to that of Cr, NiAl has the potential to be an alternative underlayer to Cr. However, the (002) crystallographic texture of the NiAl films is difficult to obtain. It is found that the (002) texture in NiAl underlayers can be achieved by employing a seed layer of either (002) textured Cr or MgO. Because of the improved texture a significant increase of the in-plane coercivity in CoCrPt/NiAl films was obtained. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361644
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  • 9
    Electronic Resource
    Electronic Resource
    Anisotropy and magnetostriction measurement by interferometry : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6884-6886 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Extending the use of a laser-Doppler interferometer that measures magnetostriction by measuring the deflection of a thin-film cantilever sample to also measure the anisotropy is reported. When the sample is driven with a rotating magnetic field of constant magnitude, a number of harmonics of twice the rotating field frequency are evidence of the magnetization vector lagging and leading the drive field around the sample. Altering the magnitude of the drive field so that the H vector traces out an ellipse is found to null the harmonic signals. This ellipse has its major axis aligned with the hard axis. Using the Stoner–Wohlfarth single-domain-particle model, it is shown that a rotating field will cause the magnetization to rotate around the particle uniformly only if the difference in magnitude between the fields along the major and minor axes is equal to the anisotropy field. Measurements on isotropic and anisotropic samples confirm the theory.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356820
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  • 10
    Electronic Resource
    Electronic Resource
    Design, fabrication, switching, and optical characteristics of new magneto-optic spatial light modulator (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 1910-1919 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new reflected mode magneto-optic spatial light modulator (R-MOSLM) has been developed for miniature optical correlators and computers. A factor of 4 improvement in pixel switching sensitivity, compared to the conventional transmission mode magneto-optic spatial light modulator, has been achieved by the use of narrower drive lines, and burying the conductor into the film. A factor of 3 higher resolution and a factor of 2 higher optical efficiency have also been achieved by the use of smaller pixels and narrower pixel gaps. The smaller pixels and improved switching sensitivity permit an order of magnitude reduction in optical path length and increase in frame rate, respectively. The progress that has been made in the design of the R-MOSLM, issues concerning its fabrication, a comparison by finite element analysis of field modeling to experimentally determined current requirements to drive individual lines, and some optical characteristics are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357673
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