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  • 1
    Electronic Resource
    Electronic Resource
    Theory of microstructural depth profiling by photothermal measurements (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 4739-4745 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An analytical solution for the photothermally measurable surface temperature of a sample with piecewise linearly inhomogeneous depth profile of the thermal conductivity k is presented. Based on this solution an inversion algorithm using a sequence of one-parameter fits is suggested in order to estimate the k profile. Numerical simulations demonstrate the performance of the approach and its insensitivity to random errors. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359409
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  • 2
    Electronic Resource
    Electronic Resource
    Photothermal depth profiling using only phase data (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 5289-5291 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Surface problems in photothermal depth profiling of technical surfaces arise from the intrinsic optical absorptivity; therefore, it is not appropriate to use amplitude values for profile reconstruction. We report a reconstruction technique based only on phase data. The performance of this approach was tested successfully by measuring the thermal conductivity profiles of laser hardened steel samples. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363516
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Experimental results of photothermal microstructural depth profiling (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4108-4111 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Experimental results of thermal conductivity depth profiling of case-hardened steel and mechanically loaded ceramics are presented, based on an inversion algorithm for a sample with piecewise linearly inhomogeneous depth profile of the thermal conductivity. The photothermally obtained profiles are interpreted or compared with results from conventional or destructive measuring techniques. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359869
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    Paper (German National Licenses)
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