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  • 1
    Electronic Resource
    Electronic Resource
    Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1757-1764 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have investigated the reliability of a variety of metal coated and semiconductor tips for use in conducting atomic force microscopy experiments in an ultrahigh vacuum (UHV) environment. In order to obtain reliable conduction data we find it necessary to first clean the tips using a short argon ion sputter. Scanning transmission electron microscopy is used to image tips after the conductivity experiments and found to be very useful for assessing tip wear and interpreting conductivity data. Tip reliability is found to be strongly dependent on the sample and the experimental conditions. Wear and contamination of the tip are found to be severe problems which are related to the tip-sample adhesion. We illustrate these effects and highlight some of the common reliability problems which we encountered using specific examples. In general, we find that metal coated tips are not reliable enough to obtain repeatable data, especially if lateral forces are exerted on the tip. Homogeneous semiconductor tips, once cleaned, are found to be satisfactory and a particular contrast with experiments performed in air is that Si tips can be used reliably. In addition we find that in UHV, conduction experiments may be reliably performed even at very low applied force, of order nano-Newtons. This is a clear advantage in comparison to experiments performed in air where surface contamination is present and applied forces on the order of micro-Newtons are often required to establish stable electrical contact. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148838
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  • 2
    Electronic Resource
    Electronic Resource
    Lateral stiffness of the tip and tip-sample contact in frictional force microscopy (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 970-972 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In atomic force and frictional force microscopy, quantitative interpretation of lateral stiffness at the tip-sample contact requires a detailed understanding of all factors contributing to the frictional force as measured in a typical experiment. We used a scanning transmission electron microscope to image and determine the geometry of the tip apex of a variety of atomic force microscope cantilevers. On the basis of this measured structure, we then used finite element analysis to model the lateral stiffness of the tip and found that the tip stiffness is often smaller than the lateral stiffness of the cantilever. Furthermore, we analyzed the stiffness of the tip sample contact and found that for sharp tips the contact stiffness can also be comparable to the lateral stiffness of the cantilever. If these two effects are ignored, significant errors can result in the calculation of lateral forces. We demonstrated the effects of lateral tip and contact stiffness experimentally and used the measurements to calculate the radius of the tip-sample contact. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118476
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  • 3
    Electronic Resource
    Electronic Resource
    High resolution eddy current microscopy (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 383-385 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a sensitive scanning force microscope based technique for measuring local variations in resistivity by monitoring changes in the eddy current induced damping of a cantilever with a magnetic tip oscillating above a conducting sample. To achieve a high sensitivity, we used a cantilever with an FeNdBLa particle mounted on the tip. Resistivity measurements are demonstrated on a silicon test structure with a staircase doping profile. Regions with resistivities of 0.0013, 0.0041, and 0.022 Ω cm are clearly resolved with a lateral resolution of approximately 180 nm. For this range of resistivities, the eddy current induced damping is found to depend linearly on the sample resistivity. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1339840
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  • 4
    Electronic Resource
    Electronic Resource
    Force microscopy imaging in liquids using ac techniques (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 409-411 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Two ac techniques for imaging under liquids using atomic force microscopy are investigated. In the first method, the sample is oscillated with a sinusoidal displacement, whereas in the second method, the cantilever is oscillated with a sinusoidal magnetic force. Both techniques are successful for topographic imaging under liquids with the tip in repulsive contact with the sample. Of the two methods, the cantilever driven technique is found to be less noisy. In addition to topographic imaging, noncontact magnetic force imaging under liquid is demonstrated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112317
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  • 5
    Electronic Resource
    Electronic Resource
    Conduction and mechanical properties of atomic scale gold contacts (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 3132-3134 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a dynamic atomic force microscopy (AFM) technique in ultrahigh vacuum, we have directly measured the stiffness and conduction characteristics of a gold tip and sample. The method involves the application of a small sinusoidal oscillating force to the tip at a frequency well below the primary resonance frequency of the cantilever. By measuring the change in amplitude during the approach and retraction of the sample we have a continuous and accurate measure of the contact stiffness. The high sensitivity of this technique has enabled us to measure the mechanical properties of the junction during its initial formation. The most interesting observations are made in the region of initial contact formation where it is not possible to obtain high mechanical sensitivity from the commonly used static force measurement technique. In this region, as the contact is compressed, the contact softens continuously while the conductance remains constant prior to discrete conductance jumps. These are accompanied by simultaneous jumps in stiffness, as predicted by molecular dynamic simulations. Furthermore, the jumps show a strong tendency to half integer values of the conductance quantum. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125254
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