ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
The transient grating technique was used to study the optical properties of hydrogenated amorphous silicon films. A carrier lifetime τe=3.3 μs, a diffusion coefficient D=4.4×10−2 cm2/s, and effective third order nonlinear susceptibility χ(3)=(5.1±1.0)×10−7 esu were measured for λpump=532 nm. The electronic and thermal contributions of the grating were estimated by diffracting a continuous wave HeNe laser beam. For intensities 1.4–4.1 mW/cm2, ∼68% of the response at 633 nm is of electronic origin. A slowly rising diffraction component was also observed. © 1995 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.113581
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