Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 2990-2994 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure of amorphous hydrogenated boron nitride films, with nominal composition B3N:H, is characterized with respect to hydrogen bonding and distribution by combined application of nuclear-magnetic-resonance (NMR) spectroscopy, electron-spin-resonance spectroscopy, and evolved gas analysis. Previous infrared studies on annealed films suggest that hydrogen is present in multiple configurations; qualitatively, low-temperature anneals (∼600 °C) deplete N-H moieties whereas B-H configurations are depleted at higher temperatures (∼1050 °C). Gas analysis corroborates these results, showing H2 peaks at ∼570 and ∼950 °C. From an analysis of nuclear dipolar couplings extracted from the 1H NMR spectra, it is concluded that the hydrogen is essentially randomly distributed as monohydrides; other configurations, such as dihydrides and monohydride clusters, are estimated to be less than 20% total. Furthermore, the 1H NMR spectra show no evidence of molecular H2 trapped in the films. In a film exposed to a high x-ray dose (∼30 kJ cm−3), it was determined that the damage was equivalent to 1 unpaired electron spin per 175 B3N:H units. The 1H NMR linewidth did not change after irradiation, which suggests that the hydrogen spatial distribution was unaffected.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Chemistry of materials 5 (1993), S. 1710-1714 
    ISSN: 1520-5002
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1285-1287 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The roughening kinetics of copper films synthesized by low pressure chemical vapor deposition (LPCVD) on Si(100) substrates was investigated by scanning tunneling microscopy (STM). By applying the dynamic scaling theory to the STM images, a steady growth roughness exponent α=0.81±0.05 and a dynamic growth roughness exponent β=0.62±0.09 were determined. The value of α is consistent with growth model predictions incorporating surface diffusion. The value of β, while higher than expected from these models, can be related to LPCVD processing conditions favoring growth instabilities. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...