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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 2 (1973), S. 125-128 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: In some cases in XRFA the influence of interfering element lines on the measured line intensity cannot be suppressed by the resolving power of the crystal spectrometer or by PHS. In many of these cases it is possible to enhance the signal to background ratio by means of a suitable detector gas.
    Notes: Bei manchen Analysenproblemen in der RFA reichen das Auflösungsvermogen des Kristalls und die Impulshöhendiskriminierung nicht aus, um den Einfluss von Storlinien zu unterdrücken. In vielen dieser Fälle kann durch Verwendung spezifischer Zählrohrgase eine erhebliche Verbesserung des Signal-Untergrund-Verhältnisses erreicht werden.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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