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  • 1
    Electronic Resource
    Electronic Resource
    Dislocation images in X-ray section topographs of curved crystals (1991)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 24 (1991), S. 304-311 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The contrast of dislocation images in X-ray section topographs of curved crystals has been investigated both experimentally and by computer simulation. Good agreement is found between experiment and simulation in both symmetric and asymmetric Laue geometries. Very little change is observed in the symmetric Laue images for radii of curvature as small as 18 m. In the asymmetric geometry, the background intensity rises and the Kato fringe visibility decreases as the curvature increases. The dynamical image becomes more localized and dominates the image as the direct image visibility falls. Our results explain the reversal of dislocation contrast in Lang projection topographs of curved crystals taken in asymmetric geometry.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889891001619
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    A Novel Beam-Conditioning Monochromator for High-Resolution X-ray Diffraction (1995)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 28 (1995), S. 314-317 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: This paper describes a novel duMond-configuration monochromator for high-resolution X-ray diffraction. The device consists of two single-crystal blocks of silicon each containing two beam channels cut respectively parallel to and 17.65° from the (011) planes. In the high-intensity mode, with Cu Kα1, radiation, the beam divergence is 11.5" and the dispersion is 1.3 × 10−4 with intensity comparable with that from a symmetric Ge 022 device. The high-resolution setting has a divergence of 4.4" and dispersion of 4.9 × 10−5, the intensity being a factor of ten lower than in the high-intensity setting. Parallel lateral translation of the two elements permits a rapid switch between the high-resolution and high-intensity settings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889895000355
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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