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  • 1
    Electronic Resource
    Electronic Resource
    An EXAFS study of the metallofullerene YC82: is the yttrium inside the cage? (1992)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 96 (1992), S. 7153-7156 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100197a003
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    New instrument for microbeam analysis incorporating submicron imaging and resonance ionization mass spectrometry (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3168-3176 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new reflectron time-of-flight mass spectrometer for surface analysis has been developed that incorporates a Schwarzschild all-reflecting microscope. The instrument is configured for secondary ion mass spectrometry and secondary neutral mass spectrometry using either ion beam bombardment or laser ablation for sample atomization. The sample viewing and imaging system of this instrument enables in situ laser microanalysis with a lateral resolution below 1 μm. The major advantages of using a Schwarzschild objective include good lateral resolution, easy design, low cost, complete achromatism, and both viewing the sample and extracting secondary or photoions normal to its surface. The instrument has a mass resolution of m/Δm≥2000 and is capable of measuring elemental and isotopic compositions at trace levels using resonance ionization. The isotopic ratios of trace concentrations of Ti in μm size SiC grains separated from meteorites were measured. The extremely low ablation laser power used in the above experiment points to the possibility of using low-cost laser systems for laser microprobe applications. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145546
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Autodetachment study of the electronic spectroscopy of FeO− (1987)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 86 (1987), S. 1858-1867 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The anion FeO− was studied by autodetachment spectroscopy in a coaxial laser–ion beam photodetachment spectrometer. Transitions were observed between the ground electronic state of the ion and several excited electronic states near the electron detachment threshold. Rotational assignments were carried out for several bands, and the measured linewidths yielded autodetachment lifetimes as a function of rotational energy for these bands. The results indicate a 4Δ ground state of FeO−. The autodetachment lifetimes show that some of the excited electronic states are dipole bound, and that one weakly bound state may be a valence excited state.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.452137
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Infrared spectrum and autodetachment dynamics of NH− (1985)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 83 (1985), S. 4364-4373 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The infrared vibration-rotation spectrum of NH− has been obtained by autodetachment spectroscopy in a coaxial laser–ion beam spectrometer. Transitions from the v=0 to v=1 vibrational levels were excited with an F-center laser, and subsequent autodetachment from the v=1 levels was observed. The apparatus resolution was better than 20 MHz, allowing the resolution of the fine structure and Λ-doubling transitions. The linewidths of the autodetachment resonances revealed some of the dynamics of the autodetachment process. The autodetachment rates were, in general, much greater for the upper Λ-doublet levels of NH−(v=1) than for the lower levels. In addition, the increase of the autodetachment rate with rotational energy for the upper levels was much faster than would be predicted if vibrational autodetachment were the primary detachment mechanism. It therefore appears that rotational-electronic coupling plays an important role in this system, and the differences in the Λ-doublet autodetachment rates are explained in terms of this mechanism.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.449052
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  • 5
    Electronic Resource
    Electronic Resource
    Autodetachment spectroscopy and dynamics of CH2CN− and CD2CN− (1987)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 87 (1987), S. 6842-6853 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The technique of autodetachment spectroscopy is utilized in a study of two electronic states of CH2CN− and CD2CN−. The ground electronic state is a normal valence state while the outermost electron in the excited state is bound by the dipole moment of the neutral radical. Autodetachment occurs from excited rotational levels of this dipole bound state, giving some 5000 sharp features near the photodetachment threshold. All of these features were assigned and spectroscopic constants for both states are reported. The binding energy of the electron in this latter state is determined to be (approximately-less-than)66 cm−1 and analysis of the autodetachment spectrum shows the electron affinities of CH2CN and CD2CN to be ∼12 500 and ∼12 430 cm−1, respectively. The dynamics of the autodetachment process is studied and various mechanisms for detachment are described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.453379
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  • 6
    Electronic Resource
    Electronic Resource
    Production of high-brightness continuous wave proton beams with very high proton fractionsa) (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 1642-1645 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article demonstrates a new technique to significantly enhance the proton fraction of an ion beam extracted from a plasma ion source. We employ a magnetically confined microwave driven source, though the technique is not source specific and can probably be applied equally effectively to other plasma sources such as Penning and multicusp types. Specifically, we dope the plasma with about 1% H2O, which increases the proton fraction of a 45 keV 45 mA beam from 75% to 90% with 375 W 2.45 GHz power to the source and from 84% to 92% for 500 W when the source is operated under nonresonant conditions. Much of the remaining fraction of the beam comprises a heavy mass ion we believe to be N+ impurity ions resulting from the conditions under which the experiments were performed. If so, this impurity can easily be removed and much higher proton fractions could be expected. Preliminary measurements show the additive has no adverse effect on the emittance of the extracted beam, and source stability is greatly improved.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146908
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    Production of high-brightness continuous wave proton beams with very high proton fractions (abstract)a) : Proceedings of the 6th international conference on ion sources (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 1239-1239 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article demonstrates a new technique to significantly enhance the proton fraction of an ion beam extracted from a plasma ion source. We employ a magnetically confined microwave driven source, though the technique is not source specific and can probably be applied equally effectively to other plasma sources such as Penning and multicusp types. Specifically, we dope the plasma with about 1% H2O, which increases the proton fraction of a 45 keV 45 mA beam from 75% to 90% with 375 W 2.45 GHz power to the source and from 84% to 92% for 500 W when the source is operated under nonresonant conditions. Much of the remaining fraction of the beam comprises a heavy mass ion we believe to be N+ impurity ions resulting from the conditions under which the experiments were performed. If so, this impurity can easily be removed and much higher proton fractions could be expected. Preliminary measurements show the additive has no adverse effect on the emittance of the extracted beam, and source stability is greatly improved.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147239
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    Paper (German National Licenses)
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