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Synchrotron radiation applications of charge coupled device detectors (invited) : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)

Clarke, Roy ; Lowe, Walter P. ; MacHarrie, R. A. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 63 (1992), S. 784-789

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Scientific charge coupled devices (CCDs) offer many opportunities for high brightness synchrotron radiation applications where good spatial resolution and fast data acquisition are important. We describe the use of virtual-phase CCD pixel arrays as two-dimensional area detectors illustrating the techniques with results from recent x-ray scattering, imaging, and absorption spectroscopy studies at NSLS, CHESS, SRC, and LURE DCI. The virtual phase architecture allows direct frontside illumination of the CCD detector chips giving advantages in the speed and sensitivity of the detector. Combining developments in x-ray optics (dispersive geometry), position sensitive area detectors (CCDs), and fast data acquisition, we have been able to perform time-resolved measurements at the microsecond level. Current developments include faster data transfer rates so that the single bunch timing structure of third generation synchrotron sources can be exploited.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1142662

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In situ X-ray diffraction of the early stages of the crystallization of Fe80B20 (1993)

Brizard, C. ; Rodricks, B. ; Alp, E. ; [et al.]

Springer

Journal of materials science 28 (1993), S. 1503-1508

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ISSN: 1573-4803

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics

Notes: Abstract A new technique has been used for the early stages of crystallization of amorphous materials, like metallic alloys. In situ X-ray diffraction has been performed during the early stages of crystallization of Fe80B20. The samples are resistively heated to 600°C in a customized vacuum chamber. A programmable charge-coupled device detector records simultaneously the evolution of the three phases: α-Fe, Fe3B and Fe2B in the minute scale. This is the first in situ X-ray diffraction study of this system in these temperature and time scales. Interesting behaviours have been seen: appearance and disappearance of phases, α-Fe supersaturation solution in boron (found for the first time in this compound), and migration of B out of the α-Fe matrix. The two-dimensional diffraction pictures show topography irregularities indicating crystallite inhomogeneties.