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  • 1
    Electronic Resource
    Electronic Resource
    Determination of surface roughness of InP (001) wafers by x-ray scattering (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 4154-4158 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The surface roughness of polished InP (001) wafers were examined by x-ray reflectivity and crystal truncation rod (CTR) measurements. The root-mean-square roughness and the lateral correlation scale were obtained by both methods. The scattering intensities in the scans transverse to the specular reflection rod were found to contain two components. A simple surface model of surface faceting is proposed to explain the experimental data. The sensitivities of the two methods to the surface structure and the role of the resolution functions in the CTR measurements are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357366
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  • 2
    Electronic Resource
    Electronic Resource
    Magnetic properties of Fe/Pd multilayers grown by electron-beam evaporation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3965-3970 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic properties of [Fe(20 A(ring))/Pd(x A(ring))]25 multilayers prepared by ultrahigh vacuum electron-beam evaporation are presented. It is found that the crystal structure of Fe layers change from bcc to fcc when the thickness of Pd layers dPd≥36 A(ring). The saturation magnetization per unit Fe volume at 5 K is enhanced and oscillates with the increment of the thickness of Pd layers, due to the polarization of Pd atoms. The magnetic hysteresis loops of samples indicate low coercive forces, and ferromagnetic coupling between the Fe layers for all Pd thicknesses (6–60 A(ring)). The conversion electron Mössbauer spectra measurements proved that the magnetic moment of fcc Fe is the same as that of the bcc Fe. It is also found that the magnetic anisotropy dependence on dPd is similar to that of the saturation magnetization, and relates to the Fe layer structure transition. The Curie temperature of Fe/Pd multilayers decreases monotonously with the increasing of dPd. The low temperature magnetization measurement of Fe/Pd multilayers suggests that the interlayer coupling between Fe layers and polarization of Pd layers influences the temperature dependence of saturation magnetization. No evidence of antiferromagnetic coupling between Fe layers and giant magnetoresistance effect is found. The relationship among structure, polarization of Pd layers, and magnetic coupling is discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358579
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  • 3
    Electronic Resource
    Electronic Resource
    Interference effects in x-ray double-crystal rocking curves of GexSi1−x/Si superlattices (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 1320-1322 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Interference effects in the x-ray double-crystal rocking curves of GexSi1−x/Si strained-layer superlattices have been simulated based on the x-ray dynamical scattering theory. We found that the A1BA2 type of structure due to unstable growth conditions causes a series of strong oscillation fringes beside the superlattice reflection satellite peaks. The positions and intensities of these oscillation fringes with respect to the superlattice satellite peaks are strongly correlated to the number of periods in the subsuperlattice layer B and the relative mean lattice mismatch between A and B with respect to the substrate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357794
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  • 4
    Electronic Resource
    Electronic Resource
    X-ray analysis of ZnSe/ZnSTe quantum structure (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2518-2520 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A novel microstructure of an A1BA2-type ZnSTe/ZnSe quantum structure has been investigated by high-resolution x-ray two-axis diffraction, reflectivity, and x-ray topography which offer a nondestructive, high-strain-sensitive method for analyzing low-dimensional structures. The results show that the molecular-beam-epitaxy growth condition was well controlled to suppress dislocations extending from the substrate and the epitaxial layers have high crystalline quality. The ZnS0.665Te0.335 epilayer undergoes a tensile strain with εT(parallel)=2.5633×10−2 and εT⊥=8.8254×10−2 while a compressed strain with εB(parallel)=2.7864×10−3 and εB⊥=9.5061×10−3 exists in the first layer of ZnSe. The interfacial roughness is about 5 A(ring) and the lateral correlation length ≥2000 A(ring). © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363035
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  • 5
    Electronic Resource
    Electronic Resource
    X-ray reflectivity studies of the effect of surfactant on the growth of GeSi superlattices (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1681-1684 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray reflectivity is applied to investigate the effect of a surfactant on the growth of Ge1−xSix/Si superlattices. It is demonstrated that the antimony layer deposited on the surface can effectively prevent the intermixing of silicon and germanium. The specular reflectivity curves show that the width of the interface is sufficiently reduced by the surfactant. The transverse scans show that the interface roughening exponent h for the sample with surfactant is larger than for the sample without surfactant, and the in-plane correlation length for the former is much larger than for the latter. This indicates that the surfactant makes less jagged and smoother interfaces and induces a different surface growth mode. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360264
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  • 6
    Electronic Resource
    Electronic Resource
    Granular magnetoresistance ribbon material suitable for isotropic magnetic field transducers (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 4918-4920 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic granular CoCu alloy ribbons were prepared by the melt-spun method, and the structural, magnetotransport, magnetic properties, and the effects of annealing on these properties were studied by x-ray diffraction, vibrating sample magnetometer, and magnetoresistance (MR) measurements at room temperature. Giant magnetoresistance was observed over a broad range of Co concentrations with a maximum MR ratio of 7.8% (at x=0.20 and 500 °C annealing) under a magnetic field of 20 kOe at room temperature. It is found that the relationship between MR and magnetic field H depended strongly on the annealing temperature and a linear MR-H relation could be obtained at an optimum annealing condition. The MR ratio did not depend on the direction between H and electric current I. These features are very suitable for making isotropic magnetic field transducers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358442
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  • 7
    Electronic Resource
    Electronic Resource
    X-ray analysis of strain relaxation in strained-layer superlattices (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 810-814 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Theoretical simulations of x-ray double-crystal-diffraction rocking curves for strain-relaxed superlattices have been successfully carried out based on x-ray dynamical diffraction theory. The strain relaxation, the misorientation between the superlattice layers and the substrate, and the effect of peak broadening due to the formation of misfit dislocations have been taken into account. The influence of possible strain relaxation mechanisms and relaxation ratios on the rocking curves have been investigated. It was found that both the mechanism and degree of the strain relaxation of the superlattice can be determined by fitting the angular positions and the relative intensities of the experimental superlattice satellites. By using this method, an InxGa1−xAs/GaAs superlattice sample and a GexSi1−x/Si superlattice sample were analyzed. The different strain-relaxation mechanisms were found in these two samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357754
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  • 8
    Electronic Resource
    Electronic Resource
    Dry laser cleaning of particles from solid substrates: Experiments and theory (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 2135-2142 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The experimental analysis of dry laser cleaning efficiency is done for certified spherical particle (SiO2, 5.0, 2.5, 1.0, and 0.5 μm) from different substrates (Si, Ge, and NiP). The influence of different options (laser wavelength, incident angle, substrate properties, i.e., type of material, surface roughness, etc.) on the cleaning efficiency is presented in addition to commonly analyzed options (cleaning efficiency versus laser fluence and particle size). Found laser cleaning efficiency demonstrates a great sensitivity to some of these options (e.g., laser wavelength, angle of incidence, etc.). Partially these effects can be explained within the frame of the microelectronics engineering (MIE) theory of scattering. Other effects (e.g., influence of roughness) can be explained along the more complex line, related to examination of the problem "particle on the surface" beyond the MIE theory. The theory of dry laser cleaning, based on one-dimensional thermal expansion of the substrate, demonstrates a great sensitivity of the cleaning efficiency on laser pulse shape. For the reasonable pulse shape this theory yields the threshold fluence by the order of magnitude larger than the experimental one. At the same time the theory, which takes into account the near-field optical enhancement and three-dimensional thermal expansion effects, yields the correct values for threshold. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1389477
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  • 9
    Electronic Resource
    Electronic Resource
    Chemical intermixing at FeMn/Co interfaces (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 150-152 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Elemental distributions of Fe, Mn, and Co in ultrathin FeMn/Co multilayers have been profiled by the x-ray anomalous scattering technique. Chemical intermixing is observed at the FeMn/Co interfaces with intermixing regions up to 14 Å. The chemical compositions in the intermixing regions are found to vary gradually from FeMn to FeMnCo2 and from FeMnCo2 to Co., respectively, but not from FeMn to Co. This result suggests that a reaction may occur and FeMnCo2 appears at the interface during the deposition. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1421629
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  • 10
    Electronic Resource
    Electronic Resource
    The effects of thermal annealing on ZnO thin films grown by pulsed laser deposition (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 498-502 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: ZnO thin films were grown on silicon (100) by pulsed laser deposition. Highly textured crystalline ZnO thin films can be grown at 600 °C. The films were then annealed at 600 °C in oxygen. The effects of annealing on chemical composition of the ZnO films were investigated by x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. The XPS spectra indicate that water has been adsorbed and then dissociated into H and OH groups. The surface properties of ZnO were studied both by scanning tunneling microscopy and scanning tunneling spectroscopy (STS). A narrow potential well has been formed on the surface of the ZnO thin films due to high density of surface states and negatively biasing the ZnO thin films during STS measurement. The discrete energy levels can be measured by STS. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373685
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