Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
6 (1973), S. 139-144
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The effect of the double-scattering process on X-ray intensity diffracted by an amorphous sample is studied in the case of &thgr;–2&thgr; diffractometric techniques with monochromator, by transmission and reflexion; the small-angle X-ray scattering method is taken into account. An experimental application shows the amount of the correction in the case of transmission.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889873008319
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