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  • 1
    Electronic Resource
    Electronic Resource
    Simulation of the thermoelastic behavior of an LLL x-ray interferometer (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1716-1722 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In order to achieve the strictest tolerances required in the manufacturing of an x-ray interferometer of the triple Laue type (LLL) to be used in the accurate determination of the silicon lattice parameter, a new shape of the analyzer crystal is considered. The simulation of its behavior proves that, if specified elastic and thermal load upper limits are satisfied, the lattice plane deformations are compatible with a measurement uncertainty of a few parts in 109. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150526
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  • 2
    Electronic Resource
    Electronic Resource
    Quantized positioning of x-ray interferometers (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 17-22 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The article demonstrates the feasibility of quantized positioning and moving scanning x-ray interferometers by feedback of traveling fringes. Two new features, feedback and equilibrium quantization, combine to yield accurate positioning and movement by successive transitions between equilibrium positions. In contrast with feedforward positioning and movement, piezoelectric linearity and stability are not subjected to strict conditions. In preliminary experiments, the performances of an x-ray interferometer were greatly improved and servo-movements up to 0.4 μm were achieved and tracked with picometer resolution. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147805
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Servopositioning with picometer resolution (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 168-173 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A macroscopic one-axis movement with picometer resolution was made possible by a feedback loop driving a piezoelectric element locking an elastic guide to a reference value, or to a reference path. The guide displacement has been measured by a high-resolution optical interferometer. Not only were prompt and accurate positionings obtained, but disturbances due to seismic noise were also compensated for. In contrast to conventional positioning, driver linearity and stability, antivibration support, and maximum displacement are not subjected to strict conditions. The performances of an x-ray interferometer were greatly improved by this feedback: the positioning with 1-pm resolution over 30-Hz bandwidth and 0.1-mm maximum displacement was made possible.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144420
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    A displacement and angle interferometer with subatomic resolution (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 3076-3081 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The position and angle measurements discussed in the paper are carried out by application of a displacement-angle interferometer which employs a single laser and is capable of resolutions better than 1 pm and 1 nrad. Angle and displacement values are simultaneously obtained by measuring the phase shifts between four points of the interference pattern with the use of a position-sensitive detector. Though the instrument resembles an optical lever, it is largely insensitive to beam movements, since angle values are obtained by phase rather than position measurements. The interferometer design and performance are discussed, emphasis being given to applications in x-ray/optical interferometry.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144362
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Lattice parameter and thermal expansion of monocrystalline silicon (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 5396-5400 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present experimental results for the lattice parameter and the thermal expansion of a silicon monocrystal at room temperature. In the precision determination of the Avogadro constant, an accurate knowledge of the value of the thermal expansion of silicon monocrystals is necessary so that their unit cell and molar volumes can both be referred to the same temperature. Recent advances in x-ray interferometry have made it possible to reduce the uncertainty of that value by one order of magnitude. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366308
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  • 6
    Electronic Resource
    Electronic Resource
    Scanning X-ray interferometry and the silicon lattice parameter: towards relative uncertainty? (1999)
    Springer
    The European physical journal 9 (1999), S. 225-232 
    Details
    ISSN: 1434-6036
    Keywords: PACS. 06.20.Jr Determination of fundamental constants - 06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, displacements, including nanometer-scale displacements) - 61.10.-i X-ray diffraction and scattering
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: In order to reduce measurement uncertainty of the (220) lattice spacing of silicon to a few parts per 109, a combined X-ray and optical interferometer capable of millimeter scans is being tested. A new series of measurements confirmed the value obtained with our previous set-up, and the bounds of measurement uncertainty were investigated. The article supplements the analysis of the error budget and provides a safer footing for the monocrystalline silicon lattice parameter value.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s100510050760
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  • 7
    Electronic Resource
    Electronic Resource
    Lattice bending in x-ray interferometers (1989)
    Springer
    The European physical journal 76 (1989), S. 25-31 
    Details
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract This paper investigates both theoretically and experimentally the effect of lattice bending on the output signals of a two-crystal x-ray interferometer of the Laue LLL type. The cross section intensity of the outgoing beams is modulated by the moiré effect produced by the overlapping of the analysing lattice on the x-ray standing field in front of it. Since the intensities of the transmitted and diffracted beams are integrated, the moiré pattern causes loss of visibility in the x-ray fringes and a non-linear phase shift, which depends on the pitch alignment of the analysing crystal with respect to the fixed crystal. The analysis of this phase shift allows the lattice curvature to be estimated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01323484
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  • 8
    Electronic Resource
    Electronic Resource
    A Fourier optics model of two-beam scanning laser interferometers (1999)
    Springer
    The European physical journal 5 (1999), S. 433-440 
    Details
    ISSN: 1434-6079
    Keywords: PACS. 42.25.Fx Diffraction and scattering - 42.25.Hz Interference
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract: The article illustrates the use of Fourier optics to describe the operation of two-beam scanning laser interferometers. It deals with the effect of diffraction on the spatial periodicity of a monochromatic and coherent beam. Particular attention is given to the analysis of systematic errors in high-accuracy laser metrology. The article reviews the special case of plane wave and Gaussian illuminations, examines how beam truncation affects the period of traveling fringes and presents a general relation between the relative wavelength deviation and the impulse standard deviation of the photons.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s100530050275
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