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  • 1
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Particle and Particle Systems Characterization 13 (1996), S. 143-149 
    ISSN: 0934-0866
    Keywords: Chemistry ; Industrial Chemistry and Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Process Engineering, Biotechnology, Nutrition Technology
    Notes: A planar phase Doppler system is used to measure submicron droplets generated by an electrospray. Measured drop dia-meters are correlated with the liquid properties and the condition for transition of the spray from the single-jet mode to the multi-jet mode is introduced. In another set of measurements using a standard phase Doppler system, combined size and velocity data are employed to deduce the drag force on the drops. In a situation where the drag force is balanced primarily by the electric force, the phase Doppler measurements allow to estimate the power-law relationship between the charge on a drop and its diameter and hence, many provide insights into the underlying atomization mechanisms.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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