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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 3332-3339 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In order to investigate the causes that produce some of the unwanted effects observed in the resistance versus temperature profiles, a variety of sources of error for resistance measurements in superconductors, using a standard four-probe configuration, have been studied. A piece of superconducting Y1Ba2Cu3O7−x ceramic material has been used as the test sample, and the resulting effects in both accuracy and precision in its temperature dependent resistance are reported here. Studied measurement error sources include thermal emf's, temperature sweep rates, Faraday currents, electrical-contact failures at the sample's surface, thermal contractions at mechanically attached instrumental wires, external electromagnetic fields, and slow sampling rates during data acquisition. Details of the experimental setup and its measurement error function are also given. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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