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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Microchimica acta 133 (2000), S. 313-317 
    ISSN: 1436-5073
    Keywords: Key words: PIXE; heavy ion X-ray production cross sections; trace analysis ; PACS: 32.80Hd.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract.  Various K-, L- and M-shell X-ray production cross sections are measured for heavy ion impact on elements in the range Z 2 = 13 to 83. The ion species range from Z 1 = 10 to 36, and ion energies from 1 to 16 MeV are used. Enhanced cross sections are observed when the projectile K- or L- binding energy is similar to the energy of the target K-, L- or M-shell. This effect is used to improve the analysis sensitivity for selected elements. As an example trace analysis of Fe in glass with V, Mn, Co and Ni ions is investigated. Results are compared with proton induced X-ray emission analysis on the same samples. In these samples Fe-Kα X-ray production is similar for irradiation with 3 MeV protons and 14 MeV Ni ions. However the signal to background ratio is four times higher for the irradiation with Ni ions as compared to irradiation with protons. Advantages and drawbacks of heavy ion induced X-ray emission for quantitative analysis compared to proton induced X-ray emission analysis are discussed.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Interface science 2 (1995), S. 311-345 
    ISSN: 1573-2746
    Keywords: grain boundaries ; high-resolution electron microscopy ; atomic-scale structure ; relaxation modes
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Our ability to observe atomic-scale features of grain boundaries has tremendously improved during the past decade. In this paper we give, aided by a number of examples, a select overview, on progress in the field of grain boundary research directly related to the advent of modern high-resolution electron microscopy (HREM) instruments (point-to-point resolution better than 0.2 nm). Examples of grain boundary issues addressed by atomic structure observations of grain boundaries in oxides and metals will be given with emphasis on systematic investigations of the role of macroscopic and microscopic grain boundary parameters. Since comparisons between observed interface structures and atomistic computer modeling results are quite important, considerable efforts towards quantification have been undertaken recently by a number of authors. Most valuable insights have been obtained by the systematic examination of a range of grain boundary structures, using a combination of experimental observations and computer modeling results. In this manner HREM observations have been invaluable not only as a test of theoretical models, but also by exposing common atomic-scale features of high-angle grain boundaries. This has brought us closer to the goal of generating a general understanding of the interface structure and its connection to properties. Such studies have given valuable insights regarding the correlations between macroscopic grain boundary geometry, interfacial energy, and atomic relaxation modes.
    Type of Medium: Electronic Resource
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