ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The structural changes, 2H → faulted 2H → faulted 4H → 4H, in CdI2 crystals, which are caused by successive heat treatments, were studied by X-ray diffraction. The faulted 2H and faulted 4H structures, which give diffraction patterns composed of sharp spots and diffuse streaks, were solved on the assumption that sharp spots arise from the `average structure' and diffuse streaks from a stacking disorder of layers. It was revealed that (1) each of the faulted 2H and faulted 4H structures is maintained unchanged over a certain range of heating temperature and (2) when two kinds of layer, V and V′, are stacked in the faulted structures, a small number of V′ layers are always followed by a large number of V layers.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889878013242
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