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  • 1
    Electronic Resource
    Electronic Resource
    New mechanism to balance the torque induced in a goniometer axis : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1706-1708 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new mechanism to balance the torque induced on goniometer arms was developed to prevent serious mechanical difficulties of goniometers. Since the amount of the torque induced by its own weight depends on the goniometer angle, a new angle-dependent torque is applied to the goniometer arms to balance the original torque. A system based on this mechanism consists of an angle sensor, a function calculator, and an actuator. The goniometer angle is detected by a displacement gauge, and subsequently converted to the appropriate value of the air pressure applied by an electropneumatic controller. A new torque is applied by the controller through a wire to the goniometer arm to balance the original torque. Nearly "torque-free'' operation of the goniometer became possible by this system, which was installed on the 2θ axis of the four-circle goniometer in the triple-axis/four-circle diffractometer, SIN-1, at PF-BL3A. The axis has been able to scan as fast as 2θ=100°/min under a maximum torque of 500 Nm without any mechanical difficulties, for more than two years. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145824
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  • 2
    Electronic Resource
    Electronic Resource
    Upgrade of triple-axis/four-circle diffractometer at PF-BL3A : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1802-1805 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Several new goniometers were installed on the triple-axis/four-circle diffractometer, SIN-1 at PF-BL3A to improve data acquisition ability and beam collimation. The most prominent improvement is development and installation of a new two-circle/one-linear goniometer, which was designed to mount various x-ray detectors, such as an imaging plate or a multielement solid-state detector to acquire diffraction and/or fluorescence data over a wide range of scattering angles. The new goniometer and the original four-circle goniometer have a common rotation center (i.e., the four-circle goniometer center). The new goniometer can be operated independently of the four-circle goniometer for a wide range of scattering angles. The new two-circle/one-linear goniometer consists of a tandem combination of a translation stage, η, and two-circle goniometers, κ and ξ, where these axes η, κ, and ξ correspond to polar coordinates (ρ, θ, cursive-phi), respectively. Other improvements such as development of a pair of total reflection mirrors for the collimator axis are also reported. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145854
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  • 3
    Electronic Resource
    Electronic Resource
    Improvement of beam divergence in pseudoparaboloidal bending of an x-ray mirror : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2171-2173 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The surface of a flat-plate quartz mirror has been investigated by bending it into a pseudoparaboloid with the mirror bender in BL-3A. The evaluation of the beam collimation and actual mirror curvature have been made by x-ray diffraction using the (+,−,−) arrangement of Si(111) crystals. The FWHM in (+,−,−) rocking curves of a whole beam was reduced from 42.7 to 14.1 arcsec with the collimating mirror. The distances deviating from the ideal paraboloid were found to be very small, i.e., less than 0.6 and 3.5 μm in ±200 and ±400 mm in the mirror length, respectively. The efficiency of the mirror was also estimated from the CeO2 diffraction patterns which were slightly but significantly improved in FWHM and peak intensity with the collimation. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145695
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  • 4
    Electronic Resource
    Electronic Resource
    Vertically and horizontally focusing beam line BL-3A of the Photon Factory : Proceedings of the 4th international conference on synchrotron radiation instrumentation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 1047-1050 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An x-ray beam line BL-3A at the Photon Factory has been designed and constructed to have optical components of a collimating paraboloidal mirror, a sagittal-focusing double-crystal monochromator, and a focusing paraboloidal mirror. The evaluation at the (+,−,−) setting of Si (111) showed that the vertical angular divergence was reduced from 13.4 to 9.5 (arcsec) by the collimating mirror. The vertical focusing with two mirrors gave the beam size of 0.2 mm (1/50). The horizontal beam size was reduced to 1/60 by sagittal focusing.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143195
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  • 5
    Electronic Resource
    Electronic Resource
    Structural Change Caused by Substitution of Nd for Sm in (Nd, Sm)AlO3: Application of Synchrotron High-Resolution Powder X-ray Diffraction (1998)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 31 (1998), S. 663-671 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Structural change caused by substitution of Nd for Sm in perovskite (Nd, Sm)AlO3 was analysed by application of high-resolution powder X-ray diffraction using synchrotron radiation. The parallel, well monochromated and bright incident X-rays improved the full width at half-maximum (FWHM) to 0.027° in a wide 2θ range for the standard Si powder. Applying this high-resolution optical system, the lattice parameters of the solid solution (Ndx, Sm_{1-x})AlO3 were precisely analysed for the phases from x = 0.0 to 1.0 with an interval of 0.2. The lattice parameters of a series of RAlO3 vary systematically with the average ionic radii of R^{3+}, accompanying a structural change from orthorhombic to a trigonal system at around R^{3+}=1.11 Å corresponding to average ionic radii of 0.7{\rm Nd}^{3+}+0.3{\rm Sm}^{3+}. In orthorhombic phases, deformation of the crystal lattice from its ideal cubic lattice is minimized at around x = 0.0–0.2 in (Ndx, Sm_{1-x})AlO3 and increased with increasing average ionic radii of Nd^{3+} and Sm^{3+}. The structure changes from orthorhombic to trigonal at around x = 0.7.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889898001629
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  • 6
    Electronic Resource
    Electronic Resource
    DAFS measurements using the image-plate Weissenberg method (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 908-910 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An instrumental technique for DAFS measurements which can provide site-specific information is proposed. The approach uses (i) focusing optics with parabolic mirrors and a double-crystal monochromator, (ii) the Laue and Bragg settings and (iii) data collection by the image-plate Weissenberg method. Six image exposures are recorded per plate at five intrinsic energies and one reference energy. The single-crystal measurements were performed at the Co K-absorption edge, and the 200, 220 and 311 reflections of CoO and 511 and 911 reflections of Co3O4 were used for analysis. The regression analysis of χ(k), Fourier transforms of k3χ(k) and back-Fourier filtering have been performed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049598000594
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  • 7
    Electronic Resource
    Electronic Resource
    Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation (1998)
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 1304-1308 
    Details
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: X-ray reflectivity (XR) measurements with a synchrotron radiation source were carried out for thin polymer films on a glass plate. From the XR data, the film thickness and surface and interface roughnesses could be determined. In addition, the appropriate conditions and precision for measurements were also discussed. Kiessig fringes were observed clearly for specular XR measurements of poly(methylmethacrylate) thin film. Analysis of the XR data allowed the determination of the film thickness very precisely. By a curve-fitting procedure of the XR profile, the film-surface roughness and film–substrate interface roughnesses were determined. A Fourier transform of the XR data was performed as an alternative method of evaluating the film thickness. The values for the film thickness obtained by the curve-fitting procedure and Fourier-transform procedure were slightly different from each other. One possibility for the cause of this difference may be an integral error and/or cut-off effect in the Fourier-transform procedure. The XR technique with synchrotron radiation is a very powerful tool for structural characterization of thin polymer films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0909049598006797
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