Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
87 (2000), S. 4945-4947
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Transmission electron microscopy has been used to study the reversal of the free layer of a NiMn-pinned crossed-anisotropy spin valve as a function of applied field orientation and specimen temperature. By choosing the orientation of the applied field correctly it was possible to avoid the formation of domains in the reversal process. As the temperature was raised above room temperature, the mechanism remained qualitatively unchanged until temperatures of (approximate)200 °C were reached, beyond which irreversible behavioral change began to take place. From analysis of image sequences magnetoresistance characteristics have been constructed. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.373210
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