ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Crystal and synthetic multilayer diffractors, deployed either as flat Bragg reflectors, or curved, as in the Johann configuration, are used to study the spectrum of COMPASS-D and other tokamaks in the wavelength region of 1–100 Å. In this article, we concentrate on the measurement of absolute photon fluxes and the derivation of volume emissivities of the lines and continua in the x-ray region. The sensitivities of these instruments to absolute photon flux have been constructed ab initio from the individual component efficiencies, including published values of the diffractor reflectivities, which have been checked or supplemented by measurements using a double-axis goniometer or from line branching ratios. For those tokamak plasmas, where the elemental abundances and effective ion charge are documented, the x-ray continuum intensity itself has been used as a calibration source to derive absolute instrument sensitivity, in reasonable agreement with the ab initio method. In the COMPASS-D Tokamak, changes in the effective ion charge state, Zeff, have been derived for different operating conditions, from the absolute intensity of the continuum at ∼4 Å. From the radiances of the line emission, changes in the absolute level of impurities following "boronization" of the vacuum vessel have also been documented. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147983
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