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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 2869-2871 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A pulse-modulated plasma irradiation technique was applied to hydrogenation of ZnO. Three kinds of ZnO samples were employed to investigate the electronic state of hydrogen in ZnO. Secondary-ion-mass-spectroscopy analysis using isotope tracer revealed that the surface layer to 100 nm was doped with hydrogen after the irradiation and its concentration was in the order of 1016 cm−3. The efficiency of band edge emission was increased by the hydrogenation. However, the the degree of the improvements depended on impurity and defect concentration in the original samples. It was concluded that hydrogen in ZnO passivates deep donor and acceptor states by electron transfer from hydrogen to the defects. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 352 (Aug. 2007), p. 89-94 
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Solution growth of 6H-SiC single crystal from Si-Ti-C ternary solution using theaccelerated crucible rotation technique (ACRT) was performed. The SiC growth rate exceeding 200μm/hr was achieved in several ACRT conditions. Such a high growth rate can be ascribed to theenhancement of the carbon transport from the graphite crucible to the growth interface due to theuse of the ACRT. The incorporation of inclusions of Si-Ti solvent in the grown SiC crystal was alsosignificantly suppressed by using the ACRT. The intensive convection near the growth interfaceinduced by the ACRT resulted in not only the marked increase of SiC growth rate but also thesuperior homogeneity in the surface morphology. It was concluded that faster stable growth couldbe accomplished in the SiC solution growth using the ACRT. The obtained SiC self-standing crystalexhibited homogeneous green colour without cracks and inclusions. We investigated the crystallinequality of the grown SiC crystal by means of X-ray diffraction. The, ω-scan rocking curves of(0006) reflection measured by X-ray diffraction provided the FWHM of 15-20 arc-second showingthe excellent crystallinity of the solution grown 6H-SiC single crystal
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: We performed solution growth of SiC single crystals from Si-Ti-C ternary solution usingthe accelerated crucible rotation technique (ACRT). It was confirmed that the growth rate exceeding200 μm/hr was achievable by several ACRT conditions. This high growth rate might be due to theenhancement of the carbon transport from the graphite crucible to the growth interface using theACRT. Moreover, the incorporation of inclusions of the Si-Ti solvent in the grown crystal wassignificantly suppressed by using the ACRT. It was thought that the intensive convection near thegrowth interface resulted in not only the marked increase of SiC growth rate but also the superiorhomogeneity in the surface morphology. It was concluded that faster stable growth can beaccomplished in the SiC solution growth using the ACRT
    Type of Medium: Electronic Resource
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