Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1867-1868
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A method for measuring the thickness of opaque parts to within 4 μm by inserting a small scale into the part or along side has been developed. A combination digital and analog scale is used to determine the length of the scale when viewed from the edge. This scale should be useful for applications where only one surface is exposed during machining or polishing, and where the side is also inaccessible.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142387
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