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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Analog integrated circuits and signal processing 5 (1994), S. 7-17 
    ISSN: 1573-1979
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The combined time- and frequency-domain analysis of nonlinearly loaded low-loss interconnects is addressed. We show that a variety of interconnects commonly employed in different technological applications are characterized by transfer functions, whose impulse responses have a fast initial-time structure (due to the skin effect) and a slow long-time part (due to ohmic losses). The dependence of the impulse response structure on the line parameters is discussed, along with the exact analytical solutions valid for the skin effect and ohmic losses, separately. A piecewise linear approximation of the transient functions with nonuniform sampling is proposed as an effective method to obtain high accuracy at low computational costs. Various numerical examples are used to validate the effectiveness of the proposed representation, and to show that a matched characterization of the line must be adopted in order to avoid numerical artifacts.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 10 (1997), S. 13-34 
    ISSN: 0894-3370
    Keywords: Engineering ; Numerical Methods and Modeling
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Specifying electromagnetic compatibility (EMC) is a crucial step in the performance evaluation of electrical and electronic systems. This paper describes a circuit formulation for the EMC assessment of large and complex systems.The proposed method is based on breaking the actual structure down into an aggregation of multiport devices: lumped-parameter circuits and distributed-parameter multiports. The multiconductor transmission line (MTL) model is used for the description of signal propagation along system interconnects: uniform, twisted and shielded lines are considered. Accurate prediction models (including line losses and dispersion) are utilized for the quantitative evaluation of both intrasystem compatibility and susceptibility to radiated interference.The description of the network topology makes use of the concept of an incidence matrix which is widely used in lumped-circuit theory. It is extended here to the more general case of distributed networks. The entire analysis is carried out in the frequency domain and a transient response is obtained by using inverse Fourier and Laplace transforms.Noteworthy characteristics of the method can be seen in the simplicity and effectiveness of the prediction models and in the minimal effort required for system description. The proposed method is especially significant for complex systems, where the number of connecting structures can be quite large. © 1997 by John Wiley & Sons, Ltd.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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