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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of organic chemistry 31 (1966), S. 606-607 
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of organic chemistry 28 (1963), S. 1411-1413 
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 35 (1979), S. 916-923 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Lattice imaging with tilted illumination at the 2.5 Å level has been used for the direct determination of stacking sequences in silicon carbide polytypes by observation of electron micrographs. The method employed is first demonstrated by observations of the common short-period polytypes 3C, 4H, 15R and 6H, and is then used to reveal the stacking sequences in the polytypes 9R and 129R, neither of which appear to have been reported previously. Stacking sequences in disordered and faulted materials have also been characterised.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Female D. frontalis produce the principal component of the aggregating pheromone in exceedingly small quantities. Larger amounts of the identical compound, however, are present in the hindguts of emergent male D. brevicomis Lee., therefore providing a better source of isolation and identification. ...
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 19 (1984), S. 3524-3545 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Microhardness indentation testing has been used as a means of introducing controlled localized deformation and fracture in both ion-implanted and unimplanted {1 1 1} silicon and {1 0 ¯1 2} sapphire single crystal surfaces. The microstructural alterations due to implantation with N 2 + and Al+ into silicon and Y+ into sapphire have been characterized using channelled Rutherford backscattering, transmission electron microscopy and electron channelling in the scanning electron microscope. It was found that sapphire only became amorphous at doses ⪞3×1016 Y+cm−2 which corresponds to a total energy deposition of ∼3×1023 keV cm−3 (∼44 kJ mm−3). The low-load microhardness (〈50 gf) was found to be sensitive to the thickness of the amorphous layer produced by implantation into both silicon and sapphire. Compared with the parent crystal, this layer was found both to be softer and to behave in a relatively plastic manner with considerable plastic pile-up occurring around indentations in the higher dose specimens. The indentation fracture behaviour was found to be dominated by the presence of implantation-induced compressive stresses. The resulting effects were: (a) a decrease in the size of the radial crack traces (henceK IC is apparently increased when evaluated using indentation fracture mechanics), (b) a decrease in the frequency of occurrence of lateral break-out in silicon and subsurface lateral cracking in sapphire, (c) initiation of lateral cracks further below the surface in both silicon and sapphire. Thus in general, it is concluded that hardness and surface plasticity are associated with softer amorphous layers whilst indentation fracture modifications are principally stress related.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 19 (1984), S. 845-860 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Load-variant microhardness tests have been used to investigate the hardness behaviour of ion-implanted (1 1 1) silicon wafers. A variety of ion doses, energies and species, including n-type, p-type and isovalent ions, have been implanted. At the high doses used (1 to 8 x 1017 ions cm2−), all implantations resulted in a surface amorphous layer being formed. The microhardness behaviour has been interpreted in terms of the presence of a surface layer of lower hardness than the substrate. The thickness of this layer has been investigated experimentally using Rutherford backscattering and the results correlated with simple theoretical predictions. Finally, the microhardness behaviour of a soft layer on a harder substrate has been modelled in order to try to predict the hardness variations arising from differing layer thicknesses and different indentation sizes. It is concluded that the amorphous layer produced by implantation appears to show no variation of microhardness with load and has a hardness typically between 400 and 700 Vickers (VHN). Further, the previously reported “critical dose” of ∼ 4 x 1017 ions cm−2 necessary to observe significant surface softening seems to correspond to the regime in which the amorphous layer shows a rapid increase with dose.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 27 (1992), S. 839-852 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Attempts have been made to produce modified reaction-bonded silicon carbide (RBSC) ceramics by incorporating a dispersion of other phases into the initial powder mix. ZrC, TiC, TaC and B4C were chosen as additives together with TiB2 as a phase likely to produce microcrack toughening in the final compact. During fabrication an important factor appears to be the possible reactions of the added phase with liquid silicon during the infiltration stage of the process. Thus, while all the carbides react with liquid silicon to form refractory silicides and new silicon carbide, this only significantly affected the reaction-bonding process if the dissolution/reaction kinetics were so fast as to disrupt the formation of the new silicon carbide framework which grows epitaxially to bond the existing silicon carbide particles together. As with conventional RBSC, the initial SiC grits play no part in any reaction except to act as nucleation sites for the new SiC. The microstructures of the various new materials have been characterized by reflected light microscopy, scanning electron microscopy, energy dispersive X-ray analysis and X-ray diffraction. This has led to an appraisal of the high-temperature reactions observed to have occurred and the unreliability of the high-temperature thermochemical data used to predict their occurrence. The mechanical properties of the new materials have been investigated by indentation testing (hardness and fracture toughness), including temperature-variant tests. Results are presented and the possibility for improving the properties of RBSC are discussed.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 27 (1992), S. 1683-1689 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The hardness behaviour of four partially stabilized zirconias has been examined as a function of load and temperature. For all materials, it was found that as the load was decreased the hardness increased, by up to 50%. However, a further reduction in load caused a drastic reduction in hardness. The degree of this near-surface softening could be correlated to the proportion of tetragonal phase present. As the temperature of indentation was increased the hardness decreased. Irrespective of alloying and ageing, the hardness values tended towards the same value at the eutectoid temperature.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 4 (1985), S. 1364-1370 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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